TY - JOUR
T1 - Metrological Characteristics of Dual-Tree Complex Wavelet Transform for Surface Analysis
AU - Zeng, W.
AU - Jiang, X.
AU - Scott, P.
PY - 2005/5/27
Y1 - 2005/5/27
N2 - The metrological characteristics of a newly developed dual-tree complex wavelet transform (DT-CWT) for surface analysis are investigated, especially on the aspect of transmission characteristics analysis. The property of zero/linear phase by the DT-CWT ensures filtering results with no distortion and good ability for feature localization. Due to the 'steep transmission curve' property of the amplitude transmission characteristic, the DT-CWT can separate different frequency components efficiently. Both computer simulation and experimental results of practical surface 2D/3D filtering prove that the DT-CWT filter is very suitable for the separation and extraction of frequency components such as surface roughness, waviness and form.
AB - The metrological characteristics of a newly developed dual-tree complex wavelet transform (DT-CWT) for surface analysis are investigated, especially on the aspect of transmission characteristics analysis. The property of zero/linear phase by the DT-CWT ensures filtering results with no distortion and good ability for feature localization. Due to the 'steep transmission curve' property of the amplitude transmission characteristic, the DT-CWT can separate different frequency components efficiently. Both computer simulation and experimental results of practical surface 2D/3D filtering prove that the DT-CWT filter is very suitable for the separation and extraction of frequency components such as surface roughness, waviness and form.
KW - Dual-Tree Complex Wavelet Transform
KW - Metrological Characteristic
KW - Surface Metrology
KW - Transmission Characteristic
UR - http://www.scopus.com/inward/record.url?scp=21344463084&partnerID=8YFLogxK
U2 - 10.1088/0957-0233/16/7/002
DO - 10.1088/0957-0233/16/7/002
M3 - Article
AN - SCOPUS:21344463084
VL - 16
SP - 1410
EP - 1417
JO - Measurement Science and Technology
JF - Measurement Science and Technology
SN - 0957-0233
IS - 7
ER -