Metrological Characteristics of Dual-Tree Complex Wavelet Transform for Surface Analysis

W. Zeng, X. Jiang, P. Scott

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)


The metrological characteristics of a newly developed dual-tree complex wavelet transform (DT-CWT) for surface analysis are investigated, especially on the aspect of transmission characteristics analysis. The property of zero/linear phase by the DT-CWT ensures filtering results with no distortion and good ability for feature localization. Due to the 'steep transmission curve' property of the amplitude transmission characteristic, the DT-CWT can separate different frequency components efficiently. Both computer simulation and experimental results of practical surface 2D/3D filtering prove that the DT-CWT filter is very suitable for the separation and extraction of frequency components such as surface roughness, waviness and form.

Original languageEnglish
Pages (from-to)1410-1417
Number of pages8
JournalMeasurement Science and Technology
Issue number7
Publication statusPublished - 27 May 2005


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