Metrological evaluation of Integrated Electronics Piezo-Electric Accelerometer measurement chains in industrial applications: Modelling and characterisation of noise

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Integrated Electronics Piezo-Electric (IEPE) accelerometers are widely used for vibration monitoring in industrial manufacturing applications due to their linearity, dynamic range, and robustness. However, the accuracy of the vibration data using such sensors can be limited by noise sources within the measurement chain. This paper experimentally characterizes the noise parameters of IEPE accelerometers to improve measurement uncertainty. The metrological traceability of the IEPE sensor to a laser interferometer standard is established according to the ISO 16063-11. Sources of electronic, mechanical, and environmental noise, both internal and external to the accelerometer, are quantified through a series of static and dynamic tests. Noise modelling techniques are presented to optimize sensor configuration, cabling, and data acquisition parameters based on the target frequency range and environment. This work provides a rigorous metrology approach for industrial users for effective application of IEPE accelerometers considering a more robust approach towards their calibration, incorporating factors of noise. It is anticipated that the outcomes from this approach will further support traceable, and low-uncertainty vibration monitoring to enhance process control and machining accuracy.
Original languageEnglish
Title of host publicationProceedings of EUSPEN 24th International Conference & Exhibition 
Number of pages4
Publication statusE-pub ahead of print - 14 Jun 2024
Event24th International Conference & Exhibition for European Society for Precision Engineering and Nanotechnology - Dublin, Ireland
Duration: 10 Jun 202414 Jun 2024
Conference number: 24


Conference24th International Conference & Exhibition for European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2024
Internet address

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