Metrology and characterisation of defects on barrier layers for thin film flexible photovoltaics

M. S. Elrawemi, L. Blunt, L. Fleming

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reports on the recent work carried out as part of the EU funded NanoMend project. Part of the project seeks to develop integrated process inspection, cleaning, repair and associated control systems for the manufacture of large area, nano-scale thin films of CIGS (Copper Indium Gallium Selenide CuInxGa (1-x) Se2) flexible PVs. Transparent barrier films such as aluminium-oxide (Al2O3) can be used as a barrier to oxygen and/or water vapor permeation and such layers are of increasing interest for the encapsulation of flexible PV modules. However, the existence of micro and nano-scale defects in the barrier surface topography has been shown to have the potential to facilitate water vapor ingress, thereby reducing cell efficiency and causing internal electrical shorts in the CIGS cells. Therefore, improvement of the quality of these barrier films is critical to reduce the susceptibility of these photovoltaic systems to environmental degradation. This paper reports on the development of a characterisation method for defect detection and then correlates this with measured water vapor transmission rates (WVTRs). The results show small numbers of large defects play the dominant role in determining the WVTR. A unified classification system for defects is proposed where the classification breaks down the defects types into four main functional groupings.

LanguageEnglish
Title of host publicationConference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014
Publishereuspen
Pages165-168
Number of pages4
Volume1
ISBN (Electronic)9780956679031
Publication statusPublished - 2014
Event14th International Conference of the European Society for Precision Engineering and Nanotechnology - Dubrovnik, Croatia
Duration: 2 Jun 20146 Jun 2014
Conference number: 14
http://nanofutures.info/sites/default/files/Dubrovnik%20Call%20For%20Papers.pdf (Link to Call for Papers and Event Details)

Conference

Conference14th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2014
CountryCroatia
CityDubrovnik
Period2/06/146/06/14
OtherCome and join your international peers, maintaining their leading edge on technology, customers, partners and suppliers. Access the greatest minds in micro and nano research and development. Share knowledge and information, and stimulate conversations
Internet address

Fingerprint

Steam
barrier layers
Water vapor
metrology
water vapor
Thin films
Defects
defects
thin films
Indium
gallium selenides
indium selenides
Aluminum Oxide
Surface topography
Gallium
Weathering
Encapsulation
Permeation
Copper
Cleaning

Cite this

Elrawemi, M. S., Blunt, L., & Fleming, L. (2014). Metrology and characterisation of defects on barrier layers for thin film flexible photovoltaics. In Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014 (Vol. 1, pp. 165-168). euspen.
Elrawemi, M. S. ; Blunt, L. ; Fleming, L. / Metrology and characterisation of defects on barrier layers for thin film flexible photovoltaics. Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014. Vol. 1 euspen, 2014. pp. 165-168
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Elrawemi, MS, Blunt, L & Fleming, L 2014, Metrology and characterisation of defects on barrier layers for thin film flexible photovoltaics. in Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014. vol. 1, euspen, pp. 165-168, 14th International Conference of the European Society for Precision Engineering and Nanotechnology, Dubrovnik, Croatia, 2/06/14.

Metrology and characterisation of defects on barrier layers for thin film flexible photovoltaics. / Elrawemi, M. S.; Blunt, L.; Fleming, L.

Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014. Vol. 1 euspen, 2014. p. 165-168.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Elrawemi MS, Blunt L, Fleming L. Metrology and characterisation of defects on barrier layers for thin film flexible photovoltaics. In Conference Proceedings - 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014. Vol. 1. euspen. 2014. p. 165-168