Miniaturized Optical Measurement Methods for Surface Nanotechnology

X. Jiang, D. Whitehouse

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The paper introduces some new types of optical surface measurement methods. One method uses spatial light-wave scanning to replace mechanical stylus scanning, and an optical fibre interferometer to replace optically bulky interferometers either of which are involved in almost all current surface measurement (stylus and optical) methods. The optical principle is based on measuring the phase shift of light reflected from the surface by using a combination of Wavelength/Frequency-Division-Multiplexing (WDM or FDM) and Fibre Bragg Grating (FBG) techniques. The WDM/FDM-FBG techniques provide the implementation of phase-to-depth and wavelength-to-field detection, and can offer a large dynamic measurement ratio (range/resolution) with a high signal-to-noise ratio (robustness).

Original languageEnglish
Pages (from-to)577-580
Number of pages4
JournalCIRP Annals - Manufacturing Technology
Volume55
Issue number1
DOIs
Publication statusPublished - 2006

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Frequency division multiplexing
Nanotechnology
Surface measurement
Fiber Bragg gratings
Wavelength division multiplexing
Interferometers
Scanning
Wavelength
Electric current measurement
Phase shift
Optical fibers

Cite this

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Miniaturized Optical Measurement Methods for Surface Nanotechnology. / Jiang, X.; Whitehouse, D.

In: CIRP Annals - Manufacturing Technology, Vol. 55, No. 1, 2006, p. 577-580.

Research output: Contribution to journalArticle

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