@inproceedings{13f578d664b4454da7efc94e8b867899,
title = "Modular system of additive manufacturing benchmarking artefacts for XCT inspection using a design-for-metrology approach",
keywords = "Additive manufacturing, Metrology, XCT inspection",
author = "Darragh Broadbent and David Gorman and Wenhan Zeng and Shan Lou",
note = "Funding Information: The authors gratefully acknowledge EPSRC funding of the Future Advanced Metrology Hub (EP/P006930/1). The authors thank Waygate Technologies for their expertise and time in XCT data acquisition.; 2024 ASPE-EUSPEN Summer Topical Meeting : Advancing Precision in Additive Manufacturing ; Conference date: 15-07-2024 Through 19-07-2024",
year = "2024",
month = aug,
day = "1",
language = "English",
isbn = "9798331300173",
volume = "82",
pages = "51--56",
booktitle = "Proceedings of the 2024 ASPE-euspen Summer Topical Meeting on Advancing Precision in Additive Manufacturing",
publisher = "American Society for Precision Engineering, ASPE",
address = "United States",
}
