The Motif is a new method for assessing the surface topography. By setting different thresholds, the waviness and surface roughness can be separated. It emphasizes the effect of large contour peaks and valleys on the function. The contour features of the image are ignored, while the unimportant features are ignored. The parameters and merging conditions of the 2-dimensional Motif are introduced, and then the definition, evaluation parameters, and algorithms of the 3-dimensional Motif method are reviewed. Attention issues.
|Number of pages
|Zhongguo Jixie Gongcheng/China Mechanical Engineering
|Published - 2002