TY - JOUR
T1 - Multi-scale freeform surface texture filtering using a mesh relaxation scheme
AU - Jiang, Xiangqian
AU - Abdul-Rahman, Hussein S.
AU - Scott, Paul J.
PY - 2013/11
Y1 - 2013/11
N2 - Surface filtering algorithms using Fourier, Gaussian, wavelets, etc, are well-established for simple Euclidean geometries. However, these filtration techniques cannot be applied to today's complex freeform surfaces, which have non-Euclidean geometries, without distortion of the results. This paper proposes a new multi-scale filtering algorithm for freeform surfaces that are represented by triangular meshes based on a mesh relaxation scheme. The proposed algorithm is capable of decomposing a freeform surface into different scales and separating surface roughness, waviness and form from each other, as will be demonstrated throughout the paper. Results of applying the proposed algorithm to computer-generated as well as real surfaces are represented and compared with a lifting wavelet filtering algorithm.
AB - Surface filtering algorithms using Fourier, Gaussian, wavelets, etc, are well-established for simple Euclidean geometries. However, these filtration techniques cannot be applied to today's complex freeform surfaces, which have non-Euclidean geometries, without distortion of the results. This paper proposes a new multi-scale filtering algorithm for freeform surfaces that are represented by triangular meshes based on a mesh relaxation scheme. The proposed algorithm is capable of decomposing a freeform surface into different scales and separating surface roughness, waviness and form from each other, as will be demonstrated throughout the paper. Results of applying the proposed algorithm to computer-generated as well as real surfaces are represented and compared with a lifting wavelet filtering algorithm.
UR - http://www.scopus.com/inward/record.url?scp=84887059035&partnerID=8YFLogxK
U2 - 10.1088/0957-0233/24/11/115001
DO - 10.1088/0957-0233/24/11/115001
M3 - Article
AN - SCOPUS:84887059035
VL - 24
JO - Measurement Science and Technology
JF - Measurement Science and Technology
SN - 0957-0233
IS - 11
M1 - 115001
ER -