Multiscale model of honed profiles

Liqun Wu, Taiwei Quan, Wenhan Zeng, Xiangqian Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Some important profiles such as that made by honing process are skew and complex. In this paper, a new and more flexible elementary function was found to create a advanced multiscale model defined by an infinite series. In this series, each elementary term characterized a skew feature at a given scale. Some honed profiles were measured and tested by a tactile PGI profiler. The results showed that our model was allowed to characterize the skew phenomenon. Then a method was developed to study the smoothing effect caused by the stylus radius with the theory of the fractal peak radius curvature of the skew profiles. And a critical scale was found in this paper.

Original languageEnglish
Title of host publicationInternational Technology and Innovation Conference 2006
Subtitle of host publicationITIC 2006
PublisherIET
Pages1339-1341
Number of pages3
Edition524
ISBN (Print)0863416969, 9780863416965
DOIs
Publication statusPublished - 2006
EventInternational Technology and Innovation Conference 2006 - Hangzhou, China
Duration: 6 Nov 20067 Nov 2006

Publication series

NameIET Conference Publications
PublisherIET
Number524
ISSN (Print)0537-9989

Conference

ConferenceInternational Technology and Innovation Conference 2006
Abbreviated titleITIC 2006
CountryChina
CityHangzhou
Period6/11/067/11/06

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  • Cite this

    Wu, L., Quan, T., Zeng, W., & Jiang, X. (2006). Multiscale model of honed profiles. In International Technology and Innovation Conference 2006: ITIC 2006 (524 ed., pp. 1339-1341). (IET Conference Publications; No. 524). IET. https://doi.org/10.1049/cp:20060975