Multiscale model of honed profiles

Liqun Wu, Taiwei Quan, Wenhan Zeng, Xiangqian Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Some important profiles such as that made by honing process are skew and complex. In this paper, a new and more flexible elementary function was found to create a advanced multiscale model defined by an infinite series. In this series, each elementary term characterized a skew feature at a given scale. Some honed profiles were measured and tested by a tactile PGI profiler. The results showed that our model was allowed to characterize the skew phenomenon. Then a method was developed to study the smoothing effect caused by the stylus radius with the theory of the fractal peak radius curvature of the skew profiles. And a critical scale was found in this paper.

Original languageEnglish
Title of host publicationInternational Technology and Innovation Conference 2006
Subtitle of host publicationITIC 2006
Number of pages3
ISBN (Print)0863416969, 9780863416965
Publication statusPublished - 2006
EventInternational Technology and Innovation Conference 2006 - Hangzhou, China
Duration: 6 Nov 20067 Nov 2006

Publication series

NameIET Conference Publications
ISSN (Print)0537-9989


ConferenceInternational Technology and Innovation Conference 2006
Abbreviated titleITIC 2006

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    Wu, L., Quan, T., Zeng, W., & Jiang, X. (2006). Multiscale model of honed profiles. In International Technology and Innovation Conference 2006: ITIC 2006 (524 ed., pp. 1339-1341). (IET Conference Publications; No. 524). IET.