@inproceedings{465e1cb9376a4abe8f0933431c5844df,
title = "Multiscale model of honed profiles",
abstract = "Some important profiles such as that made by honing process are skew and complex. In this paper, a new and more flexible elementary function was found to create a advanced multiscale model defined by an infinite series. In this series, each elementary term characterized a skew feature at a given scale. Some honed profiles were measured and tested by a tactile PGI profiler. The results showed that our model was allowed to characterize the skew phenomenon. Then a method was developed to study the smoothing effect caused by the stylus radius with the theory of the fractal peak radius curvature of the skew profiles. And a critical scale was found in this paper.",
keywords = "Honed, Model, Multiscale, Profile, Skew",
author = "Liqun Wu and Taiwei Quan and Wenhan Zeng and Xiangqian Jiang",
year = "2006",
doi = "10.1049/cp:20060975",
language = "English",
isbn = "0863416969",
series = "IET Conference Publications",
publisher = "IET",
number = "524",
pages = "1339--1341",
booktitle = "International Technology and Innovation Conference 2006",
address = "United Kingdom",
edition = "524",
note = "International Technology and Innovation Conference 2006, ITIC 2006 ; Conference date: 06-11-2006 Through 07-11-2006",
}