Abstract
TiFeN and TiFeMoN films were deposited on silicon wafers by ion-beam-assisted deposition. Their mechanical properties were measured by nanoindentation (quasi-static) and nano-impact (dynamic) techniques. Nano-impact testing enabled assessment of their toughness and resistance to fatigue fracture under repetitive loading. At low impact forces, films with a higher resistance to plastic deformation (H3/E2) were much more resistant to the formation of cracks throughout the test. At higher impact forces, these films initially show impact resistance but with continued impacts they are unable to protect the Si substrate, performing as poorly as films with lower H3/E2 and suffer delamination from the Si substrate over a large area.
Original language | English |
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Article number | 085301 |
Journal | Journal of Physics D: Applied Physics |
Volume | 44 |
Issue number | 8 |
Early online date | 8 Feb 2011 |
DOIs | |
Publication status | Published - 2 Mar 2011 |
Externally published | Yes |