Nanoparticle ejection from Au induced by single Xe ion impacts

Robert C. Birtcher, S. E. Donnelly, S. Schlutig

Research output: Contribution to journalArticle

56 Citations (Scopus)

Abstract

In situ transmission electron microscopy has been used to observe sputtered Au during Xe ion irradiation in transmission geometry. The sputtered Au was collected on an electron transparent carbon foil. Nanoparticles were observed on the collector foil after they were ejected by single ion impacts. The ejection is from the melt zone formed during the thermal spike phase of a displacement cascade produced near the surface by a single ion impact. Such single ion impacts are also capable of producing craters. Ejected nanoparticles can make a significant contribution to sputtering.
LanguageEnglish
Pages4968-4971
Number of pages4
JournalPhysical Review Letters
Volume85
Issue number23
DOIs
Publication statusPublished - 4 Dec 2000
Externally publishedYes

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ion impact
ejection
nanoparticles
foils
ion irradiation
spikes
craters
accumulators
cascades
sputtering
transmission electron microscopy
carbon
geometry
electrons

Cite this

Birtcher, Robert C. ; Donnelly, S. E. ; Schlutig, S. / Nanoparticle ejection from Au induced by single Xe ion impacts. In: Physical Review Letters. 2000 ; Vol. 85, No. 23. pp. 4968-4971.
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Nanoparticle ejection from Au induced by single Xe ion impacts. / Birtcher, Robert C.; Donnelly, S. E.; Schlutig, S.

In: Physical Review Letters, Vol. 85, No. 23, 04.12.2000, p. 4968-4971.

Research output: Contribution to journalArticle

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