Near Common-Path Optical Fiber Interferometer for Potentially Fast On-Line Microscale-Nanoscale Surface Measurement

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

We introduce a new surface measurement method for potential online application. Compared with our previous research, the new design is a significant improvement. It also features high stability because it uses a near common-path configuration. The method should be of great benefit to advanced manufacturing, especially for quality and process control in ultraprecision manufacturing and on the production line. Proof-of-concept experiments have been successfully conducted by measuring the system repeatability and the displacements of a mirror surface.

Original languageEnglish
Pages (from-to)3603-3605
Number of pages3
JournalOptics Letters
Volume31
Issue number24
DOIs
Publication statusPublished - 15 Dec 2006

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microbalances
interferometers
manufacturing
optical fibers
quality control
mirrors
configurations

Cite this

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title = "Near Common-Path Optical Fiber Interferometer for Potentially Fast On-Line Microscale-Nanoscale Surface Measurement",
abstract = "We introduce a new surface measurement method for potential online application. Compared with our previous research, the new design is a significant improvement. It also features high stability because it uses a near common-path configuration. The method should be of great benefit to advanced manufacturing, especially for quality and process control in ultraprecision manufacturing and on the production line. Proof-of-concept experiments have been successfully conducted by measuring the system repeatability and the displacements of a mirror surface.",
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Near Common-Path Optical Fiber Interferometer for Potentially Fast On-Line Microscale-Nanoscale Surface Measurement. / Jiang, Xiangqian; Martin, Haydn; Wang, Kaiwei.

In: Optics Letters, Vol. 31, No. 24, 15.12.2006, p. 3603-3605.

Research output: Contribution to journalArticle

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