Neutral and ion beam SIMS of non-conducting materials

Engineering & Materials Science

• Secondary ion mass spectrometry 100%
• Ion beams 94%
• Atoms 68%
• Ions 61%
• Ion bombardment 53%
• Electrons 33%
• Surface potential 30%
• Sputtering 14%
• Inert gases 13%
• Electron beams 13%
• Calibration 8%
• Polymers 8%
• Experiments 3%

Physics & Astronomy

• neutral beams 75%
• secondary ion mass spectrometry 68%
• ion beams 51%
• ions 31%
• bombardment 27%
• atoms 22%
• low conductivity 19%
• charging 13%
• damage 10%
• molecular clusters 9%
• electron bombardment 9%
• saddles 8%
• mass spectra 7%
• electron impact 7%
• rare gases 6%
• fragments 6%
• histories 6%
• sputtering 5%
• electron beams 5%
• polymers 4%
• configurations 3%
• electronics 3%
• electrons 3%
• energy 2%

Chemistry

• Ion Beam 73%
• Ion Bombardment 65%
• Surface Potential 36%
• Secondary Ion Mass Spectrum 26%
• Ion 26%
• Conductivity 22%
• Cluster Ion 20%
• Electron Impact 18%
• Electron Beam 18%
• Secondary Ion Mass Spectroscopy 18%
• Electron Particle 18%
• Sputtering 18%
• Noble Gas Atom 17%
• Molecular Cluster 10%
• Energy 7%