Skip to main navigation
Skip to search
Skip to main content
University of Huddersfield Research Portal Home
Help & FAQ
Home
Profiles
Research Units
Research output
Activities
Projects
Press / Media
Datasets
Search by expertise, name or affiliation
Neutral and ion beam SIMS of non-conducting materials
JA Van den Berg
Research output
:
Contribution to journal
›
Article
›
peer-review
26
Citations (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Neutral and ion beam SIMS of non-conducting materials'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering & Materials Science
Secondary ion mass spectrometry
100%
Ion beams
94%
Atoms
68%
Ions
61%
Ion bombardment
53%
Electrons
33%
Surface potential
30%
Sputtering
14%
Inert gases
13%
Electron beams
13%
Calibration
8%
Polymers
8%
Chemistry
Ion Beam
73%
Ion Bombardment
65%
Surface Potential
36%
Secondary Ion Mass Spectrum
26%
Ion
26%
Conductivity
22%
Cluster Ion
20%
Electron Impact
18%
Electron Beam
18%
Secondary Ion Mass Spectroscopy
18%
Electron Particle
18%
Sputtering
18%
Noble Gas Atom
17%
Molecular Cluster
10%
Energy
7%
Physics & Astronomy
neutral beams
75%
secondary ion mass spectrometry
68%
ion beams
51%
ions
31%
bombardment
27%
atoms
22%
low conductivity
19%
charging
13%
damage
10%
molecular clusters
9%
electron bombardment
9%
saddles
8%
mass spectra
7%
electron impact
7%
rare gases
6%
fragments
6%
histories
6%
sputtering
5%
electron beams
5%