Neutral and ion beam SIMS of non-conducting materials

Engineering & Materials Science

• Secondary ion mass spectrometry 100%
• Ion beams 94%
• Atoms 69%
• Ions 61%
• Ion bombardment 53%
• Electrons 33%
• Surface potential 30%
• Sputtering 14%
• Inert gases 13%
• Electron beams 13%
• Calibration 8%
• Polymers 8%

Chemical Compounds

• Secondary ion mass spectrometry 100%
• Ion beams 94%
• Atoms 69%
• Ions 55%
• Ion bombardment 53%
• Surface potential 30%
• Electrons 26%
• Noble Gases 16%
• Sputtering 14%
• Electron beams 13%
• Polymers 10%
• Calibration 8%

Physics & Astronomy

• neutral beams 76%
• secondary ion mass spectrometry 68%
• ion beams 51%
• ions 31%
• bombardment 27%
• atoms 22%
• low conductivity 19%
• charging 13%
• damage 10%
• molecular clusters 9%
• electron bombardment 9%
• saddles 8%
• mass spectra 7%
• electron impact 7%
• rare gases 6%
• fragments 6%
• histories 6%
• electron beams 5%