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New image modeling approaches
Fionn Murtagh, Jean Luc Starck
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peer-review
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Earth & Environmental Sciences
modeling
48%
earth observation
40%
registration
36%
image processing
36%
image analysis
35%
wavelet
33%
synthetic aperture radar
31%
transform
29%
methodology
22%
Physics & Astronomy
synthetic aperture radar
54%
image analysis
42%
image processing
38%
methodology
31%
Chemistry
Filtration
100%
Application
36%