@inproceedings{3d24c270a37f4f20840192f310b87b75,
title = "New reference line for estimating roughness of an arbitrary curved surface",
abstract = "In this paper the authors deal emphatically with the problem of deciding the estimating reference of the roughness of an arbitrary curved surface and put forth a method of fitting its estimating reference with the polynomial ya+bx+cx (l By an analysis of a circular spheroid sample it has been proved that calculation using this model is both highly accurate and very convenient.",
keywords = "Optical engineering, Surface roughness",
author = "Shaojun Xiao and Xiangqian Jiang and Xie, {Tie Bang}",
note = "Funding Information: •s This project supported by National Natural Science Foundation of China Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Measurement Technology and Intelligent Instruments 1993 ; Conference date: 29-10-1993 Through 05-11-1993",
year = "1993",
month = sep,
day = "22",
doi = "10.1117/12.156319",
language = "English",
volume = "2101",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "909--913",
editor = "Li Zhu",
booktitle = "Measurement Technology and Intelligent Instruments",
address = "United States",
}