New reference line for estimating roughness of an arbitrary curved surface

Shaojun Xiao, Xiangqian Jiang, Tie Bang Xie

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper the authors deal emphatically with the problem of deciding the estimating reference of the roughness of an arbitrary curved surface and put forth a method of fitting its estimating reference with the polynomial ya+bx+cx (l By an analysis of a circular spheroid sample it has been proved that calculation using this model is both highly accurate and very convenient.

Original languageEnglish
Title of host publicationMeasurement Technology and Intelligent Instruments
EditorsLi Zhu
PublisherSPIE
Pages909-913
Number of pages5
Volume2101
ISBN (Electronic)9780819413840
DOIs
Publication statusPublished - 22 Sep 1993
Externally publishedYes
EventMeasurement Technology and Intelligent Instruments 1993 - Wuhan, China
Duration: 29 Oct 19935 Nov 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2101
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceMeasurement Technology and Intelligent Instruments 1993
Country/TerritoryChina
CityWuhan
Period29/10/935/11/93

Fingerprint

Dive into the research topics of 'New reference line for estimating roughness of an arbitrary curved surface'. Together they form a unique fingerprint.

Cite this