Abstract
This chapter provides information to new areal characterization techniques. Two main uses of surface texture are discussed that include control of the manufacturing process and control of the functional performance of the component. Field parameters, such as the traditional surface texture parameters, use a statistical basis to characterize a cloud of points. Field parameters are excellent for process monitoring. Feature parameters characterize surface features and their structural relationships. Feature parameters are more functionally diagnostic than field parameters. Pattern analysis concepts are introduced to surface texture as a framework for feature parameters. Continuous and lattice data are also described in the chapter. Later, the surface segmentation and the rules for segment combination are discussed as a process to determine significant features in a surface. Specifically, the concept of a change tree and methods to prune a change tree to determine significant features is introduced. Finally two examples are presented to illustrate the techniques developed in the chapter.
Original language | English |
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Title of host publication | Advanced Techniques for Assessment Surface Topography |
Subtitle of host publication | Development of a Basis for 3D Surface Texture Standards "SURFSTAND" |
Editors | Liam Blunt, Xiangqian Jiang |
Publisher | Elsevier Inc. |
Chapter | 3 |
Pages | 43-61 |
Number of pages | 19 |
ISBN (Electronic) | 9780080526522 |
ISBN (Print) | 9781903996119 |
DOIs | |
Publication status | Published - 2003 |
Externally published | Yes |