Abstract
In this paper, a novel photovoltaic (PV) hot-spotting fault detection algorithm is presented. The algorithm is implemented using the analysis of 2580 polycrystalline silicon PV modules distributed across the U.K. The evaluation of the hot-spots is analyzed based on the cumulative density function (CDF) modeling technique, whereas the percentage of power loss (PPL) and PV degradation rate are used to categorize the hot-spots into eight different categories. Next, the implemented CDF models are used to predict possible PV hot-spots affecting the PV modules. The developed algorithm is evaluated using three different PV modules affected by three different hot-spots. Remarkably, the proposed CDF models precisely categorize the PV hot-spots with a high rate of accuracy of almost above 80%.
Original language | English |
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Article number | 8685128 |
Pages (from-to) | 378-386 |
Number of pages | 9 |
Journal | IEEE Transactions on Device and Materials Reliability |
Volume | 19 |
Issue number | 2 |
Early online date | 11 Apr 2019 |
DOIs | |
Publication status | Published - 5 Jun 2019 |