Abstract
A method of solving numerically the one-dimensional diffusion equation for arbitrary profiles and arbitrary functional dependencies of the diffusion coefficient on the position, diffusant, concentration and the time, is described. The technique is applied to a variety of diffusion problems in semiconductor quantum wells to illustrate its power and versatility. In particular solutions are shown for diffusion of graded interfaces, a concentration dependent diffusion coefficient, and the effect of a depth and time dependent diffusion coefficient on a superlattice, as occurs in ion implantation and the subsequent annealing out of the resulting radiation damage. The depth dependence of the intermixing due to ion implantation and subsequent rapid thermal anneal, of a GaAs/Ga1-xAxAs multiple-quantum-well structure, is deduced from the broadening of the low temperature photoluminescence emission.
| Original language | English |
|---|---|
| Pages (from-to) | 81-90 |
| Number of pages | 10 |
| Journal | Physica Status Solidi (B) Basic Research |
| Volume | 197 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Sept 1996 |
| Externally published | Yes |
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