On-machine metrology for aspheric optics testing

Christopher W. King, Niall McGee, David Loke, David Riley, Gerry McCavana, Richard Freeman, Roger Morton, David Walker, Sam Wei, Ping Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages33-38
Number of pages6
Volume49
Publication statusPublished - 1 Dec 2010
Externally publishedYes
EventAmerican Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology - The Crowne Plaza, Asheville, United States
Duration: 23 Jun 201025 Jun 2010
http://www.aspe.net/meetings/2010_Summer/ASPE_Summer_Program.pdf (Link to Event Programme)

Conference

ConferenceAmerican Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology
Abbreviated titleASPE 2010
CountryUnited States
CityAsheville
Period23/06/1025/06/10
Internet address

Cite this

King, C. W., McGee, N., Loke, D., Riley, D., McCavana, G., Freeman, R., ... Zhou, P. (2010). On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 (Vol. 49, pp. 33-38)
King, Christopher W. ; McGee, Niall ; Loke, David ; Riley, David ; McCavana, Gerry ; Freeman, Richard ; Morton, Roger ; Walker, David ; Wei, Sam ; Zhou, Ping. / On-machine metrology for aspheric optics testing. Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49 2010. pp. 33-38
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title = "On-machine metrology for aspheric optics testing",
author = "King, {Christopher W.} and Niall McGee and David Loke and David Riley and Gerry McCavana and Richard Freeman and Roger Morton and David Walker and Sam Wei and Ping Zhou",
year = "2010",
month = "12",
day = "1",
language = "English",
isbn = "9781887706544",
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King, CW, McGee, N, Loke, D, Riley, D, McCavana, G, Freeman, R, Morton, R, Walker, D, Wei, S & Zhou, P 2010, On-machine metrology for aspheric optics testing. in Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. vol. 49, pp. 33-38, American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology, Asheville, United States, 23/06/10.

On-machine metrology for aspheric optics testing. / King, Christopher W.; McGee, Niall; Loke, David; Riley, David; McCavana, Gerry; Freeman, Richard; Morton, Roger; Walker, David; Wei, Sam; Zhou, Ping.

Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49 2010. p. 33-38.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - On-machine metrology for aspheric optics testing

AU - King, Christopher W.

AU - McGee, Niall

AU - Loke, David

AU - Riley, David

AU - McCavana, Gerry

AU - Freeman, Richard

AU - Morton, Roger

AU - Walker, David

AU - Wei, Sam

AU - Zhou, Ping

PY - 2010/12/1

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M3 - Conference contribution

SN - 9781887706544

VL - 49

SP - 33

EP - 38

BT - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

ER -

King CW, McGee N, Loke D, Riley D, McCavana G, Freeman R et al. On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49. 2010. p. 33-38