On-machine metrology for aspheric optics testing

Christopher W. King, Niall McGee, David Loke, David Riley, Gerry McCavana, Richard Freeman, Roger Morton, David Walker, Sam Wei, Ping Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages33-38
Number of pages6
Volume49
Publication statusPublished - 1 Dec 2010
Externally publishedYes
EventAmerican Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology - The Crowne Plaza, Asheville, United States
Duration: 23 Jun 201025 Jun 2010
http://www.aspe.net/meetings/2010_Summer/ASPE_Summer_Program.pdf (Link to Event Programme)

Conference

ConferenceAmerican Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology
Abbreviated titleASPE 2010
CountryUnited States
CityAsheville
Period23/06/1025/06/10
Internet address

Cite this

King, C. W., McGee, N., Loke, D., Riley, D., McCavana, G., Freeman, R., Morton, R., Walker, D., Wei, S., & Zhou, P. (2010). On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 (Vol. 49, pp. 33-38)