On-machine metrology for aspheric optics testing

Christopher W. King; Niall McGee; David Loke; David Riley; Gerry McCavana; Richard Freeman; Roger Morton; David Walker; Sam Wei; Ping Zhou

On-machine metrology for aspheric optics testing

Christopher W. King, Niall McGee, David Loke, David Riley, Gerry McCavana, Richard Freeman, Roger Morton, David Walker, Sam Wei, Ping Zhou

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages	33-38
Number of pages	6
Volume	49
Publication status	Published - 1 Dec 2010
Externally published	Yes
Event	American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology - The Crowne Plaza, Asheville, United States Duration: 23 Jun 2010 → 25 Jun 2010 http://www.aspe.net/meetings/2010_Summer/ASPE_Summer_Program.pdf (Link to Event Programme)

Conference

Conference	American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology
Abbreviated title	ASPE 2010
Country/Territory	United States
City	Asheville
Period	23/06/10 → 25/06/10
Internet address	http://www.aspe.net/meetings/2010_Summer/ASPE_Summer_Program.pdf (Link to Event Programme)

Cite this

@inproceedings{1205c3cca647440087fc97422331ab2b,

title = "On-machine metrology for aspheric optics testing",

author = "King, \{Christopher W.\} and Niall McGee and David Loke and David Riley and Gerry McCavana and Richard Freeman and Roger Morton and David Walker and Sam Wei and Ping Zhou",

year = "2010",

month = dec,

day = "1",

language = "English",

isbn = "9781887706544",

volume = "49",

pages = "33--38",

booktitle = "Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010",

note = "American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology, ASPE 2010 ; Conference date: 23-06-2010 Through 25-06-2010",

url = "http://www.aspe.net/meetings/2010\_Summer/ASPE\_Summer\_Program.pdf",

}

King, CW, McGee, N, Loke, D, Riley, D, McCavana, G, Freeman, R, Morton, R, Walker, D, Wei, S & Zhou, P 2010, On-machine metrology for aspheric optics testing. in Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. vol. 49, pp. 33-38, American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology, Asheville, North Carolina, United States, 23/06/10.

TY - GEN

T1 - On-machine metrology for aspheric optics testing

AU - King, Christopher W.

AU - McGee, Niall

AU - Loke, David

AU - Riley, David

AU - McCavana, Gerry

AU - Freeman, Richard

AU - Morton, Roger

AU - Walker, David

AU - Wei, Sam

AU - Zhou, Ping

PY - 2010/12/1

Y1 - 2010/12/1

UR - https://www.scopus.com/pages/publications/84884311130

M3 - Conference contribution

AN - SCOPUS:84884311130

SN - 9781887706544

VL - 49

SP - 33

EP - 38

BT - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

T2 - American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology

Y2 - 23 June 2010 through 25 June 2010

ER -

On-machine metrology for aspheric optics testing

Conference

Other files and links

Cite this