Optimization of integrated circuits placement for electric field reduction inside telecommunications equipment using Monte Carlo simulation and parallel recombinative simulated annealing

Sotirios K. Goudos, Zaharias D. Zaharis, Pavios I. Lazaridis, Philippe B. Gallion

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This article presents a novel approach to the modeling and reduction of electromagnetic interference (EMI) caused by radiated emissions of integrated circuits (ICs) inside rectangular metallic enclosures of telecommunications devices. This type of analysis applies for several types of modern telecommunications equipment found in highspeed networks as well as in mobile communications. A generic model of such a device is created. The ICs are modeled as small electric dipoles and their interaction with the enclosure walls is studied by using the dyadic Green's functions. The electric field on the enclosure walls is computed and its reduction is studied as optimization problem using evolutionary algorithms. Two algorithms are employed: Genetic algorithms (GAs) and parallel recombinative simulated annealing (PRSA). PRSA is a hybrid evolutionary strategy that inherits properties from both GAs and simulated annealing. Monte Carlo simulation is subsequently applied to the optimization results to derive the electric field on the metallic walls and also to perform a worst-case analysis. The applications of the above approach in early PCB design process are discussed.

Original languageEnglish
Pages (from-to)3049-3055
Number of pages7
JournalMicrowave and Optical Technology Letters
Volume49
Issue number12
DOIs
Publication statusPublished - Dec 2007
Externally publishedYes

Fingerprint

Telecommunication equipment
simulated annealing
enclosure
Simulated annealing
Enclosures
integrated circuits
Integrated circuits
telecommunication
Electric fields
genetic algorithms
optimization
electric fields
Genetic algorithms
dyadics
polychlorinated biphenyls
electromagnetic interference
simulation
Polychlorinated Biphenyls
Signal interference
Polychlorinated biphenyls

Cite this

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title = "Optimization of integrated circuits placement for electric field reduction inside telecommunications equipment using Monte Carlo simulation and parallel recombinative simulated annealing",
abstract = "This article presents a novel approach to the modeling and reduction of electromagnetic interference (EMI) caused by radiated emissions of integrated circuits (ICs) inside rectangular metallic enclosures of telecommunications devices. This type of analysis applies for several types of modern telecommunications equipment found in highspeed networks as well as in mobile communications. A generic model of such a device is created. The ICs are modeled as small electric dipoles and their interaction with the enclosure walls is studied by using the dyadic Green's functions. The electric field on the enclosure walls is computed and its reduction is studied as optimization problem using evolutionary algorithms. Two algorithms are employed: Genetic algorithms (GAs) and parallel recombinative simulated annealing (PRSA). PRSA is a hybrid evolutionary strategy that inherits properties from both GAs and simulated annealing. Monte Carlo simulation is subsequently applied to the optimization results to derive the electric field on the metallic walls and also to perform a worst-case analysis. The applications of the above approach in early PCB design process are discussed.",
keywords = "Electromagnetic compatibility, Genetic algorithms, Green's functions calculation, Monte Carlo simulation, Parallel programming, Simulated annealing",
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T1 - Optimization of integrated circuits placement for electric field reduction inside telecommunications equipment using Monte Carlo simulation and parallel recombinative simulated annealing

AU - Goudos, Sotirios K.

AU - Zaharis, Zaharias D.

AU - Lazaridis, Pavios I.

AU - Gallion, Philippe B.

PY - 2007/12

Y1 - 2007/12

N2 - This article presents a novel approach to the modeling and reduction of electromagnetic interference (EMI) caused by radiated emissions of integrated circuits (ICs) inside rectangular metallic enclosures of telecommunications devices. This type of analysis applies for several types of modern telecommunications equipment found in highspeed networks as well as in mobile communications. A generic model of such a device is created. The ICs are modeled as small electric dipoles and their interaction with the enclosure walls is studied by using the dyadic Green's functions. The electric field on the enclosure walls is computed and its reduction is studied as optimization problem using evolutionary algorithms. Two algorithms are employed: Genetic algorithms (GAs) and parallel recombinative simulated annealing (PRSA). PRSA is a hybrid evolutionary strategy that inherits properties from both GAs and simulated annealing. Monte Carlo simulation is subsequently applied to the optimization results to derive the electric field on the metallic walls and also to perform a worst-case analysis. The applications of the above approach in early PCB design process are discussed.

AB - This article presents a novel approach to the modeling and reduction of electromagnetic interference (EMI) caused by radiated emissions of integrated circuits (ICs) inside rectangular metallic enclosures of telecommunications devices. This type of analysis applies for several types of modern telecommunications equipment found in highspeed networks as well as in mobile communications. A generic model of such a device is created. The ICs are modeled as small electric dipoles and their interaction with the enclosure walls is studied by using the dyadic Green's functions. The electric field on the enclosure walls is computed and its reduction is studied as optimization problem using evolutionary algorithms. Two algorithms are employed: Genetic algorithms (GAs) and parallel recombinative simulated annealing (PRSA). PRSA is a hybrid evolutionary strategy that inherits properties from both GAs and simulated annealing. Monte Carlo simulation is subsequently applied to the optimization results to derive the electric field on the metallic walls and also to perform a worst-case analysis. The applications of the above approach in early PCB design process are discussed.

KW - Electromagnetic compatibility

KW - Genetic algorithms

KW - Green's functions calculation

KW - Monte Carlo simulation

KW - Parallel programming

KW - Simulated annealing

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