Outage Performance Analysis of Content Delivery in Multiple Devices to Single Device Communications

Asaad S. Daghal, Huiling Zhu, Qasim Z. Ahmed, Yijin Pan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Device to Device (D2D) communication with content caching has recently been proposed as an exciting and innovative technology for next generation cellular networks. This paper presents a novel content caching and delivery method which allows multiple devices caching the same content and the content being sent via multiple devices to single device (MDSD) communication using D2D links to enhance user experience in terms of outage probability. A closed form expression of the outage probability is derived by considering how the content caching popularity affects achievable signal to interference plus noise ratio (SINR). The simulation and theoretical results show that as the popularity of the video increases, the outage probability of the system decreases substantially. On the other hand, the results show using MDSD enhances the SINR performance and decreases the outage probability of the system significantly.

Original languageEnglish
Title of host publication2017 IEEE 85th Vehicular Technology Conference, VTC Spring 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages5
Volume2017-June
ISBN (Electronic)9781509059324
DOIs
Publication statusPublished - 14 Nov 2017
Event85th IEEE Vehicular Technology Conference - Sydney, Australia
Duration: 4 Jun 20177 Jun 2017
Conference number: 85
http://www.ieeevtc.org/vtc2017spring/

Conference

Conference85th IEEE Vehicular Technology Conference
Abbreviated titleVTC2017-Spring
CountryAustralia
CitySydney
Period4/06/177/06/17
Internet address

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  • Cite this

    Daghal, A. S., Zhu, H., Ahmed, Q. Z., & Pan, Y. (2017). Outage Performance Analysis of Content Delivery in Multiple Devices to Single Device Communications. In 2017 IEEE 85th Vehicular Technology Conference, VTC Spring 2017 - Proceedings (Vol. 2017-June). [8108401] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCSpring.2017.8108401