Hot spotting is a reliability problem in photovoltaic (PV) panels where a mismatched cell heats up significantly and degrades PV panel output-power performance. High PV cell temperature due to hot spotting can damage the cell encapsulate and lead to second breakdown, where both cause permanent damage to the PV panel. Therefore, the development of two hot-spot mitigation techniques is proposed using a simple and reliable method. PV hot spots in the examined PV system were inspected using the FLIR i5 thermal imaging camera. Multiple experiments have been tested during various environmental conditions, where the PV module I - V curve was evaluated in each observed test to analyze the output-power performance before and after the activation of the proposed hot-spot mitigation techniques. One PV module affected by the hot spot was tested. The output power during high irradiance levels is increased to approximately 1.26 W after the activation of the first hot-spot mitigation technique. However, the second mitigation technique guarantees an increase in the power up to 3.97 W. An additional test has been examined during the partial shading condition. Both proposed techniques ensure a decrease in the shaded PV cell temperature; thus, there is an increase in PV output power.
|Number of pages||9|
|Journal||IEEE Transactions on Device and Materials Reliability|
|Early online date||6 Dec 2017|
|Publication status||Published - 1 Mar 2018|