Pattern clustering based on noise modeling in wavelet space

Fionn Murtagh, Jean Luc Starck

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We describe an effective approach to object or feature detection in point patterns via noise modeling. This is based on use of a redundant or non-pyramidal wavelet transform. Noise modeling is based on a Poisson process. We illustrate this new method with a range of examples. We use the close relationship between image (pixelated) and point representations to achieve the result of a clustering method with constant-time computational cost.

LanguageEnglish
Pages847-855
Number of pages9
JournalPattern Recognition
Volume31
Issue number7
DOIs
Publication statusPublished - 31 Jul 1998
Externally publishedYes

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Murtagh, Fionn ; Starck, Jean Luc. / Pattern clustering based on noise modeling in wavelet space. In: Pattern Recognition. 1998 ; Vol. 31, No. 7. pp. 847-855.
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Pattern clustering based on noise modeling in wavelet space. / Murtagh, Fionn; Starck, Jean Luc.

In: Pattern Recognition, Vol. 31, No. 7, 31.07.1998, p. 847-855.

Research output: Contribution to journalArticle

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