Pattern clustering based on noise modeling in wavelet space

Fionn Murtagh, Jean Luc Starck

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We describe an effective approach to object or feature detection in point patterns via noise modeling. This is based on use of a redundant or non-pyramidal wavelet transform. Noise modeling is based on a Poisson process. We illustrate this new method with a range of examples. We use the close relationship between image (pixelated) and point representations to achieve the result of a clustering method with constant-time computational cost.

Original languageEnglish
Pages (from-to)847-855
Number of pages9
JournalPattern Recognition
Volume31
Issue number7
DOIs
Publication statusPublished - 31 Jul 1998
Externally publishedYes

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