Pattern Recognition for Optical PSI Images of Surface Topography Using Wavelets

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper proposes a novel philosophical approach using Wavelet and Radon Transform for addressing topographical features of surface from a PSI image. In this work, a combined technique using the Wavelet and Radon Transforms has been investigated and developed to achieve the forensic dissection of PSI image data. As a result, the isolated point-like features on a PSI image can be extracted using the wavelet transform with artifact free thresholding method, and the curve-like features on a PSI image can be identified using the Ridgelet Transform (Multi-Wavelet-Radon transform). Case studies are conducted using a series of femoral heads to demonstrate the application of using the new wavelet model in the assessment PSI images of these surfaces.

Original languageEnglish
Title of host publicationOptical Information Processing Technology
EditorsGuoguang Mu, Francis T. S. Yu, Suganda Jutamulia
PublisherSPIE
Pages149-157
Number of pages9
Volume4929
DOIs
Publication statusPublished - 16 Sep 2002
EventPhotonics Asia - Shanghai, China
Duration: 14 Oct 200218 Oct 2002

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume4929
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferencePhotonics Asia
CountryChina
CityShanghai
Period14/10/0218/10/02

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  • Cite this

    Jiang, X., Xiao, S., & Blunt, L. (2002). Pattern Recognition for Optical PSI Images of Surface Topography Using Wavelets. In G. Mu, F. T. S. Yu, & S. Jutamulia (Eds.), Optical Information Processing Technology (Vol. 4929, pp. 149-157). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 4929). SPIE. https://doi.org/10.1117/12.483206