Pattern recognition in mental processes

Determining vestiges of the subconscious through ultrametric component analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We develop a novel consensus of hierarchical clusterings. We do this in order to have a framework (including visualization and supporting interpretation) for the parts of the data that are determined to be ultrametric. Furthermore a major objective is to determine locally ultrametric relationships as opposed to non-local ultrametric relationships. This work aims at a major new application, namely quantifying and interpreting vestiges of the subconscious, or what could be arising from subconscious processes, in narrative, through finding emotional content, metaphor and other potential expressions of the subconscious, i.e. of symmetric logic as defined by the psychoanalyst, Matte Blanco.

Original languageEnglish
Title of host publication2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2014
EditorsGabriele Fariello, Witold Kinsner, Yingxu Wang, Shushma Patel, Lotfi A. Zadeh, Dilip Patel
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages155-161
Number of pages7
ISBN (Electronic)9781479960811
DOIs
Publication statusPublished - 16 Oct 2014
Externally publishedYes
Event13th IEEE International Conference on Cognitive Informatics and Cognitive Computing: From Information Revolution to Intelligence Revolution - London, United Kingdom
Duration: 18 Aug 201420 Aug 2014
Conference number: 13
https://www.ucalgary.ca/icci_cc/ICCICC2014 (Link to Conference Website)

Conference

Conference13th IEEE International Conference on Cognitive Informatics and Cognitive Computing
Abbreviated titleICCI*CC 2014
CountryUnited Kingdom
CityLondon
Period18/08/1420/08/14
Internet address

Fingerprint

Mental Processes
Pattern recognition
Visualization
Metaphor
Cluster Analysis
Consensus
Unconscious (Psychology)
Recognition (Psychology)

Cite this

Murtagh, F. (2014). Pattern recognition in mental processes: Determining vestiges of the subconscious through ultrametric component analysis. In G. Fariello, W. Kinsner, Y. Wang, S. Patel, L. A. Zadeh, & D. Patel (Eds.), 2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2014 (pp. 155-161). [6921455] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCI-CC.2014.6921455
Murtagh, Fionn. / Pattern recognition in mental processes : Determining vestiges of the subconscious through ultrametric component analysis. 2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2014. editor / Gabriele Fariello ; Witold Kinsner ; Yingxu Wang ; Shushma Patel ; Lotfi A. Zadeh ; Dilip Patel. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 155-161
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Murtagh, F 2014, Pattern recognition in mental processes: Determining vestiges of the subconscious through ultrametric component analysis. in G Fariello, W Kinsner, Y Wang, S Patel, LA Zadeh & D Patel (eds), 2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2014., 6921455, Institute of Electrical and Electronics Engineers Inc., pp. 155-161, 13th IEEE International Conference on Cognitive Informatics and Cognitive Computing, London, United Kingdom, 18/08/14. https://doi.org/10.1109/ICCI-CC.2014.6921455

Pattern recognition in mental processes : Determining vestiges of the subconscious through ultrametric component analysis. / Murtagh, Fionn.

2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2014. ed. / Gabriele Fariello; Witold Kinsner; Yingxu Wang; Shushma Patel; Lotfi A. Zadeh; Dilip Patel. Institute of Electrical and Electronics Engineers Inc., 2014. p. 155-161 6921455.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Murtagh F. Pattern recognition in mental processes: Determining vestiges of the subconscious through ultrametric component analysis. In Fariello G, Kinsner W, Wang Y, Patel S, Zadeh LA, Patel D, editors, 2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 155-161. 6921455 https://doi.org/10.1109/ICCI-CC.2014.6921455