Phase error analysis and reduction in near optical coaxial phase measuring deflectometry

Feng Gao, Yanling Li, Yongjia Xu, Zonghua Zhang, Jane Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Phase-measuring deflectometry (PMD) is a crucial technology for measuring the forms of specular surfaces. However, existing stereo-PMD techniques have noticeable weaknesses when it comes to measuring structured specular surfaces. This limitation arises because the optical axis of the imaging system must intersect significantly with the optical axis of the display system, following the law of reflection. In contrast, near optical coaxial phase measuring deflectometry (NCPMD) offers several advantages over conventional PMD techniques. These advantages include a compact configuration, lightweight design, and minimal measurement errors due to the shadows of surface structures. NCPMD achieves this by utilizing a plate beamsplitter. With the assistance of the plate beamsplitter, the optical axis of the display screen can be configured much closer to the optical axis of the imaging system. As a result, the system becomes more compact and significantly reduces volume compared to the conventional PMD configuration. However, the introduction of the plate beamsplitter can impact on the measurement accuracy of the system. Specifically, the refractive effect of the beamsplitter can reduce the measurement accuracy. To address this challenge, a refraction error model is proposed for the NCPMD system. This model considers the influence of the plate beamsplitter’s refraction, allowing for the determination of measurement errors caused by this effect. Additionally, a virtual simulation system is established to analyze the shape reconstruction error resulting from the plate beamsplitter’s refraction. According to the experiments and results, the measurement accuracy can be effectively improved after the refractive error compensation.

Original languageEnglish
Title of host publicationOptical Metrology and Inspection for Industrial Applications XI
Subtitle of host publicationProceedings Volume 13241
EditorsHan Sen, Ehret Gerd, Benyong Chen
PublisherSPIE
Number of pages8
Volume13241
ISBN (Electronic)9781510682115
ISBN (Print)9781510682108
DOIs
Publication statusPublished - 20 Nov 2024
EventSPIE/COS Photonics Asia, 2024: Optical Metrology and Inspection for Industrial Applications XI - Nantong, China
Duration: 12 Oct 202415 Oct 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume13241
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSPIE/COS Photonics Asia, 2024
Country/TerritoryChina
CityNantong
Period12/10/2415/10/24

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