Phase retrieval algorithm for line-scan dispersive interferometry

Keyphrases

• Dispersive Interferometry 100%
• Line Scan 100%
• Phase Retrieval 100%
• High-resolution 33%
• Two Dimensional 33%
• Phase Information 33%
• Surface Metrology 33%
• Measurement Repeatability 33%
• Spectral Interferogram 33%
• Interferogram 33%
• Phase Slope 33%
• Interferometer 33%
• Single-shot Measurement 33%
• Diffraction Grating 33%
• Sub-nanometer 33%
• Talysurf 33%
• Fringe Order 33%
• Nanometer Range 33%
• Order Determination 33%
• Slope Method 33%
• Chromaticity 33%
• Noise Measurement 33%
• Standard Artifact 33%
• Height Map 33%

Engineering

• Interferometry 100%
• Phase Retrieval 100%
• Experimental Result 33%
• Two Dimensional 33%
• Phase Information 33%
• Repeatability 33%
• High Resolution 33%
• Spectral Interferogram 33%
• Interferogram 33%
• Nanometer Range 33%
• Fringe Paper 33%
• Measurement Noise 33%

Physics

• Interferometry 100%
• High Resolution 20%
• Noise Measurement 20%
• Diffraction Grating 20%