Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

P. Petrik; S. Milita; G. Pucker; A. G. Nassiopoulou; J. A. Van Den Berg; M. A. Reading; M. Fried; T. Lohner; M. Theodoropoulou; S. Gardelis; M. Barozzi; M. Ghulinyan; A. Lui; L. Vanzetti; A. Picciotto

doi:10.1149/1.3204427

Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

P. Petrik, S. Milita, G. Pucker, A. G. Nassiopoulou, J. A. Van Den Berg, M. A. Reading, M. Fried, T. Lohner, M. Theodoropoulou, S. Gardelis, M. Barozzi, M. Ghulinyan, A. Lui, L. Vanzetti, A. Picciotto

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2 Citations (Scopus)

Abstract

Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties.

Original language	English
Pages (from-to)	373-378
Number of pages	6
Journal	ECS Transactions
Volume	25
Issue number	3
DOIs	https://doi.org/10.1149/1.3204427
Publication status	Published - 2009
Externally published	Yes

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Petrik, P., Milita, S., Pucker, G., Nassiopoulou, A. G., Van Den Berg, J. A., Reading, M. A., Fried, M., Lohner, T., Theodoropoulou, M., Gardelis, S., Barozzi, M., Ghulinyan, M., Lui, A., Vanzetti, L., & Picciotto, A. (2009). Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction. ECS Transactions, 25(3), 373-378. https://doi.org/10.1149/1.3204427

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abstract = "Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties.",

author = "P. Petrik and S. Milita and G. Pucker and Nassiopoulou, {A. G.} and {Van Den Berg}, {J. A.} and Reading, {M. A.} and M. Fried and T. Lohner and M. Theodoropoulou and S. Gardelis and M. Barozzi and M. Ghulinyan and A. Lui and L. Vanzetti and A. Picciotto",

year = "2009",

doi = "10.1149/1.3204427",

language = "English",

volume = "25",

pages = "373--378",

journal = "ECS Transactions",

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Petrik, P, Milita, S, Pucker, G, Nassiopoulou, AG, Van Den Berg, JA, Reading, MA, Fried, M, Lohner, T, Theodoropoulou, M, Gardelis, S, Barozzi, M, Ghulinyan, M, Lui, A, Vanzetti, L & Picciotto, A 2009, 'Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction', ECS Transactions, vol. 25, no. 3, pp. 373-378. https://doi.org/10.1149/1.3204427

TY - JOUR

T1 - Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

AU - Petrik, P.

AU - Milita, S.

AU - Pucker, G.

AU - Nassiopoulou, A. G.

AU - Van Den Berg, J. A.

AU - Reading, M. A.

AU - Fried, M.

AU - Lohner, T.

AU - Theodoropoulou, M.

AU - Gardelis, S.

AU - Barozzi, M.

AU - Ghulinyan, M.

AU - Lui, A.

AU - Vanzetti, L.

AU - Picciotto, A.

PY - 2009

Y1 - 2009

N2 - Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties.

AB - Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties.

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U2 - 10.1149/1.3204427

DO - 10.1149/1.3204427

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EP - 378

JO - ECS Transactions

JF - ECS Transactions

SN - 1938-6737

IS - 3

ER -

Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

Abstract

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