Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

P. Petrik, S. Milita, G. Pucker, A. G. Nassiopoulou, J. A. Van Den Berg, M. A. Reading, M. Fried, T. Lohner, M. Theodoropoulou, S. Gardelis, M. Barozzi, M. Ghulinyan, A. Lui, L. Vanzetti, A. Picciotto

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties.
Original languageEnglish
Pages (from-to)373-378
Number of pages6
JournalECS Transactions
Volume25
Issue number3
DOIs
Publication statusPublished - 2009
Externally publishedYes

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Ellipsometry
Nanocrystals
X ray diffraction
Photonics
Semiconductor materials
Data storage equipment

Cite this

Petrik, P., Milita, S., Pucker, G., Nassiopoulou, A. G., Van Den Berg, J. A., Reading, M. A., ... Picciotto, A. (2009). Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction. ECS Transactions, 25(3), 373-378. https://doi.org/10.1149/1.3204427
Petrik, P. ; Milita, S. ; Pucker, G. ; Nassiopoulou, A. G. ; Van Den Berg, J. A. ; Reading, M. A. ; Fried, M. ; Lohner, T. ; Theodoropoulou, M. ; Gardelis, S. ; Barozzi, M. ; Ghulinyan, M. ; Lui, A. ; Vanzetti, L. ; Picciotto, A. / Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction. In: ECS Transactions. 2009 ; Vol. 25, No. 3. pp. 373-378.
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Petrik, P, Milita, S, Pucker, G, Nassiopoulou, AG, Van Den Berg, JA, Reading, MA, Fried, M, Lohner, T, Theodoropoulou, M, Gardelis, S, Barozzi, M, Ghulinyan, M, Lui, A, Vanzetti, L & Picciotto, A 2009, 'Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction', ECS Transactions, vol. 25, no. 3, pp. 373-378. https://doi.org/10.1149/1.3204427

Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction. / Petrik, P.; Milita, S.; Pucker, G.; Nassiopoulou, A. G.; Van Den Berg, J. A.; Reading, M. A.; Fried, M.; Lohner, T.; Theodoropoulou, M.; Gardelis, S.; Barozzi, M.; Ghulinyan, M.; Lui, A.; Vanzetti, L.; Picciotto, A.

In: ECS Transactions, Vol. 25, No. 3, 2009, p. 373-378.

Research output: Contribution to journalArticle

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AU - Milita, S.

AU - Pucker, G.

AU - Nassiopoulou, A. G.

AU - Van Den Berg, J. A.

AU - Reading, M. A.

AU - Fried, M.

AU - Lohner, T.

AU - Theodoropoulou, M.

AU - Gardelis, S.

AU - Barozzi, M.

AU - Ghulinyan, M.

AU - Lui, A.

AU - Vanzetti, L.

AU - Picciotto, A.

PY - 2009

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U2 - 10.1149/1.3204427

DO - 10.1149/1.3204427

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JF - ECS Transactions

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