Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

P. Petrik, S. Milita, G. Pucker, A. G. Nassiopoulou, J. A. Van Den Berg, M. A. Reading, M. Fried, T. Lohner, M. Theodoropoulou, S. Gardelis, M. Barozzi, M. Ghulinyan, A. Lui, L. Vanzetti, A. Picciotto

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2 Citations (Scopus)

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Engineering & Materials Science