Pseudo-random tool paths for CNC sub-aperture polishing and other applications

Christina R. Dunn, David D. Walker

Research output: Contribution to journalArticle

84 Citations (Scopus)

Abstract

In this paper we first contrast classical and CNC polishing techniques in regard to the repetitiveness of the machine motions. We then present a pseudo-random tool path for use with CNC sub-aperture polishing techniques and report polishing results from equivalent random and raster tool-paths. The random tool-path used - the unicursal random tool-path -employs a random seed to generate a pattern which never crosses itself. Because of this property, this tool-path is directly compatible with dwell time maps for corrective polishing. The tool-path can be used to polish any continuous area of any boundary shape, including surfaces with interior perforations.

LanguageEnglish
Pages18942-18949
Number of pages8
JournalOptics Express
Volume16
Issue number23
DOIs
Publication statusPublished - 10 Nov 2008
Externally publishedYes

Fingerprint

polishing
apertures
perforation
dwell
seeds

Cite this

@article{fbba51d5c5a94459996809cf258207b2,
title = "Pseudo-random tool paths for CNC sub-aperture polishing and other applications",
abstract = "In this paper we first contrast classical and CNC polishing techniques in regard to the repetitiveness of the machine motions. We then present a pseudo-random tool path for use with CNC sub-aperture polishing techniques and report polishing results from equivalent random and raster tool-paths. The random tool-path used - the unicursal random tool-path -employs a random seed to generate a pattern which never crosses itself. Because of this property, this tool-path is directly compatible with dwell time maps for corrective polishing. The tool-path can be used to polish any continuous area of any boundary shape, including surfaces with interior perforations.",
author = "Dunn, {Christina R.} and Walker, {David D.}",
year = "2008",
month = "11",
day = "10",
doi = "10.1364/OE.16.018942",
language = "English",
volume = "16",
pages = "18942--18949",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "23",

}

Pseudo-random tool paths for CNC sub-aperture polishing and other applications. / Dunn, Christina R.; Walker, David D.

In: Optics Express, Vol. 16, No. 23, 10.11.2008, p. 18942-18949.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Pseudo-random tool paths for CNC sub-aperture polishing and other applications

AU - Dunn, Christina R.

AU - Walker, David D.

PY - 2008/11/10

Y1 - 2008/11/10

N2 - In this paper we first contrast classical and CNC polishing techniques in regard to the repetitiveness of the machine motions. We then present a pseudo-random tool path for use with CNC sub-aperture polishing techniques and report polishing results from equivalent random and raster tool-paths. The random tool-path used - the unicursal random tool-path -employs a random seed to generate a pattern which never crosses itself. Because of this property, this tool-path is directly compatible with dwell time maps for corrective polishing. The tool-path can be used to polish any continuous area of any boundary shape, including surfaces with interior perforations.

AB - In this paper we first contrast classical and CNC polishing techniques in regard to the repetitiveness of the machine motions. We then present a pseudo-random tool path for use with CNC sub-aperture polishing techniques and report polishing results from equivalent random and raster tool-paths. The random tool-path used - the unicursal random tool-path -employs a random seed to generate a pattern which never crosses itself. Because of this property, this tool-path is directly compatible with dwell time maps for corrective polishing. The tool-path can be used to polish any continuous area of any boundary shape, including surfaces with interior perforations.

UR - http://www.scopus.com/inward/record.url?scp=56249083566&partnerID=8YFLogxK

U2 - 10.1364/OE.16.018942

DO - 10.1364/OE.16.018942

M3 - Article

VL - 16

SP - 18942

EP - 18949

JO - Optics Express

T2 - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 23

ER -