Quadrature Wavelength Scanning Interferometry

Giuseppe Moschetti, Alistair Forbes, Richard K. Leach, Xiangqian Jiang, Daniel O'Connor

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.
LanguageEnglish
Pages5332-5340
Number of pages9
JournalApplied Optics
Volume55
Issue number20
DOIs
Publication statusPublished - 6 Jul 2016

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quadratures
interferometry
optical paths
interference
ambiguity
scanning
wavelengths
error signals
rangefinding
simulation

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Moschetti, G., Forbes, A., Leach, R. K., Jiang, X., & O'Connor, D. (2016). Quadrature Wavelength Scanning Interferometry. Applied Optics, 55(20), 5332-5340. https://doi.org/10.1364/AO.55.005332
Moschetti, Giuseppe ; Forbes, Alistair ; Leach, Richard K. ; Jiang, Xiangqian ; O'Connor, Daniel. / Quadrature Wavelength Scanning Interferometry. In: Applied Optics. 2016 ; Vol. 55, No. 20. pp. 5332-5340.
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Moschetti, G, Forbes, A, Leach, RK, Jiang, X & O'Connor, D 2016, 'Quadrature Wavelength Scanning Interferometry', Applied Optics, vol. 55, no. 20, pp. 5332-5340. https://doi.org/10.1364/AO.55.005332

Quadrature Wavelength Scanning Interferometry. / Moschetti, Giuseppe; Forbes, Alistair; Leach, Richard K.; Jiang, Xiangqian; O'Connor, Daniel.

In: Applied Optics, Vol. 55, No. 20, 06.07.2016, p. 5332-5340.

Research output: Contribution to journalArticle

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Moschetti G, Forbes A, Leach RK, Jiang X, O'Connor D. Quadrature Wavelength Scanning Interferometry. Applied Optics. 2016 Jul 6;55(20):5332-5340. https://doi.org/10.1364/AO.55.005332