Quadrature Wavelength Scanning Interferometry

Giuseppe Moschetti; Alistair Forbes; Richard K. Leach; Xiangqian Jiang; Daniel O'Connor

doi:10.1364/AO.55.005332

Quadrature Wavelength Scanning Interferometry

Giuseppe Moschetti, Alistair Forbes, Richard K. Leach, Xiangqian Jiang, Daniel O'Connor

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3 Citations (Scopus)

Abstract

A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.

Original language	English
Pages (from-to)	5332-5340
Number of pages	9
Journal	Applied Optics
Volume	55
Issue number	20
DOIs	https://doi.org/10.1364/AO.55.005332
Publication status	Published - 6 Jul 2016

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title = "Quadrature Wavelength Scanning Interferometry",

abstract = "A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.",

author = "Giuseppe Moschetti and Alistair Forbes and Leach, {Richard K.} and Xiangqian Jiang and Daniel O'Connor",

year = "2016",

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language = "English",

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T1 - Quadrature Wavelength Scanning Interferometry

AU - Moschetti, Giuseppe

AU - Forbes, Alistair

AU - Leach, Richard K.

AU - Jiang, Xiangqian

AU - O'Connor, Daniel

PY - 2016/7/6

Y1 - 2016/7/6

N2 - A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.

AB - A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.

UR - https://www.osapublishing.org/ao/home.cfm

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DO - 10.1364/AO.55.005332

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SP - 5332

EP - 5340

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 20

ER -

Quadrature Wavelength Scanning Interferometry

Abstract

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