Rapid calculation of scattering factors for partially ionized plasmas in the EUV

A. K. Rossall; G. J. Tallents

doi:10.1007/978-3-319-19521-6_49

Rapid calculation of scattering factors for partially ionized plasmas in the EUV

A. K. Rossall, G. J. Tallents

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The work presented demonstrates a newly developed, rapid algorithm for the calculation of atomic scattering factors in the EUV for partially ionized plasmas. Using element specific input data, the code REFRAC, calculates plasma refractive index, atomic scattering factors and scattering cross sections with a runtime short enough to be used in-line with fluid codes to model ablative flow from a planar target. The algorithm demonstrates good agreement with data from the Centre for X-ray Optics (CXRO) at Lawrence Berkeley National Laboratory for carbon. This work aims to accurately model moderate irradiance (> 10⁹ W cm⁻²) EUV laser absorption within solid material and expanding plasma, to characterise the ablation properties and highlight the potential applications of such lasers.

Original language	English
Title of host publication	X-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers
Editors	Jorge Rocca, Carmen Menoni, Mario Marconi
Publisher	Springer Science and Business Media, LLC
Pages	379-384
Number of pages	6
Volume	169
ISBN (Print)	9783319195209
DOIs	https://doi.org/10.1007/978-3-319-19521-6_49
Publication status	Published - 7 Oct 2015
Externally published	Yes
Event	14th International Conference on X-Ray Lasers - Fort Collins, United States Duration: 26 May 2014 → 30 May 2014

Conference

Conference	14th International Conference on X-Ray Lasers
Abbreviated title	ICXRL 2014
Country/Territory	United States
City	Fort Collins
Period	26/05/14 → 30/05/14

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title = "Rapid calculation of scattering factors for partially ionized plasmas in the EUV",

abstract = "The work presented demonstrates a newly developed, rapid algorithm for the calculation of atomic scattering factors in the EUV for partially ionized plasmas. Using element specific input data, the code REFRAC, calculates plasma refractive index, atomic scattering factors and scattering cross sections with a runtime short enough to be used in-line with fluid codes to model ablative flow from a planar target. The algorithm demonstrates good agreement with data from the Centre for X-ray Optics (CXRO) at Lawrence Berkeley National Laboratory for carbon. This work aims to accurately model moderate irradiance (> 109 W cm−2) EUV laser absorption within solid material and expanding plasma, to characterise the ablation properties and highlight the potential applications of such lasers.",

author = "Rossall, {A. K.} and Tallents, {G. J.}",

note = "No record of this in Eprints. HN 25/10/2017; 14th International Conference on X-Ray Lasers, ICXRL 2014 ; Conference date: 26-05-2014 Through 30-05-2014",

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doi = "10.1007/978-3-319-19521-6_49",

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volume = "169",

pages = "379--384",

editor = "Jorge Rocca and Carmen Menoni and Mario Marconi",

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Rossall, AK & Tallents, GJ 2015, Rapid calculation of scattering factors for partially ionized plasmas in the EUV. in J Rocca, C Menoni & M Marconi (eds), X-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers. vol. 169, Springer Science and Business Media, LLC, pp. 379-384, 14th International Conference on X-Ray Lasers, Fort Collins, Colorado, United States, 26/05/14. https://doi.org/10.1007/978-3-319-19521-6_49

Rapid calculation of scattering factors for partially ionized plasmas in the EUV. / Rossall, A. K.; Tallents, G. J.

X-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers. ed. / Jorge Rocca; Carmen Menoni; Mario Marconi. Vol. 169 Springer Science and Business Media, LLC, 2015. p. 379-384.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Rapid calculation of scattering factors for partially ionized plasmas in the EUV

AU - Rossall, A. K.

AU - Tallents, G. J.

N1 - No record of this in Eprints. HN 25/10/2017

PY - 2015/10/7

Y1 - 2015/10/7

N2 - The work presented demonstrates a newly developed, rapid algorithm for the calculation of atomic scattering factors in the EUV for partially ionized plasmas. Using element specific input data, the code REFRAC, calculates plasma refractive index, atomic scattering factors and scattering cross sections with a runtime short enough to be used in-line with fluid codes to model ablative flow from a planar target. The algorithm demonstrates good agreement with data from the Centre for X-ray Optics (CXRO) at Lawrence Berkeley National Laboratory for carbon. This work aims to accurately model moderate irradiance (> 109 W cm−2) EUV laser absorption within solid material and expanding plasma, to characterise the ablation properties and highlight the potential applications of such lasers.

AB - The work presented demonstrates a newly developed, rapid algorithm for the calculation of atomic scattering factors in the EUV for partially ionized plasmas. Using element specific input data, the code REFRAC, calculates plasma refractive index, atomic scattering factors and scattering cross sections with a runtime short enough to be used in-line with fluid codes to model ablative flow from a planar target. The algorithm demonstrates good agreement with data from the Centre for X-ray Optics (CXRO) at Lawrence Berkeley National Laboratory for carbon. This work aims to accurately model moderate irradiance (> 109 W cm−2) EUV laser absorption within solid material and expanding plasma, to characterise the ablation properties and highlight the potential applications of such lasers.

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DO - 10.1007/978-3-319-19521-6_49

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AN - SCOPUS:84951765302

SN - 9783319195209

VL - 169

SP - 379

EP - 384

BT - X-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers

A2 - Rocca, Jorge

A2 - Menoni, Carmen

A2 - Marconi, Mario

PB - Springer Science and Business Media, LLC

T2 - 14th International Conference on X-Ray Lasers

Y2 - 26 May 2014 through 30 May 2014

ER -

Rapid calculation of scattering factors for partially ionized plasmas in the EUV

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