Rapid calculation of scattering factors for partially ionized plasmas in the EUV

A. K. Rossall, G. J. Tallents

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The work presented demonstrates a newly developed, rapid algorithm for the calculation of atomic scattering factors in the EUV for partially ionized plasmas. Using element specific input data, the code REFRAC, calculates plasma refractive index, atomic scattering factors and scattering cross sections with a runtime short enough to be used in-line with fluid codes to model ablative flow from a planar target. The algorithm demonstrates good agreement with data from the Centre for X-ray Optics (CXRO) at Lawrence Berkeley National Laboratory for carbon. This work aims to accurately model moderate irradiance (> 109 W cm−2) EUV laser absorption within solid material and expanding plasma, to characterise the ablation properties and highlight the potential applications of such lasers.

Original languageEnglish
Title of host publicationX-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers
EditorsJorge Rocca, Carmen Menoni, Mario Marconi
PublisherSpringer Science and Business Media, LLC
Pages379-384
Number of pages6
Volume169
ISBN (Print)9783319195209
DOIs
Publication statusPublished - 7 Oct 2015
Externally publishedYes
Event14th International Conference on X-Ray Lasers - Fort Collins, United States
Duration: 26 May 201430 May 2014

Conference

Conference14th International Conference on X-Ray Lasers
Abbreviated titleICXRL 2014
CountryUnited States
CityFort Collins
Period26/05/1430/05/14

Fingerprint Dive into the research topics of 'Rapid calculation of scattering factors for partially ionized plasmas in the EUV'. Together they form a unique fingerprint.

  • Cite this

    Rossall, A. K., & Tallents, G. J. (2015). Rapid calculation of scattering factors for partially ionized plasmas in the EUV. In J. Rocca, C. Menoni, & M. Marconi (Eds.), X-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers (Vol. 169, pp. 379-384). Springer Science and Business Media, LLC. https://doi.org/10.1007/978-3-319-19521-6_49