Rapid calculation of scattering factors for partially ionized plasmas in the EUV

A. K. Rossall, G. J. Tallents

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The work presented demonstrates a newly developed, rapid algorithm for the calculation of atomic scattering factors in the EUV for partially ionized plasmas. Using element specific input data, the code REFRAC, calculates plasma refractive index, atomic scattering factors and scattering cross sections with a runtime short enough to be used in-line with fluid codes to model ablative flow from a planar target. The algorithm demonstrates good agreement with data from the Centre for X-ray Optics (CXRO) at Lawrence Berkeley National Laboratory for carbon. This work aims to accurately model moderate irradiance (> 109 W cm−2) EUV laser absorption within solid material and expanding plasma, to characterise the ablation properties and highlight the potential applications of such lasers.

Original languageEnglish
Title of host publicationX-Ray Lasers 2014 - Proceedings of the 14th International Conference on X-Ray Lasers
EditorsJorge Rocca, Carmen Menoni, Mario Marconi
PublisherSpringer Science and Business Media, LLC
Number of pages6
ISBN (Print)9783319195209
Publication statusPublished - 7 Oct 2015
Externally publishedYes
Event14th International Conference on X-Ray Lasers - Fort Collins, United States
Duration: 26 May 201430 May 2014


Conference14th International Conference on X-Ray Lasers
Abbreviated titleICXRL 2014
Country/TerritoryUnited States
CityFort Collins


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