Recent advances in traceable nanoscale dimension and force metrology in the UK

Richard Leach, Derek Chetwynd, Liam Blunt, Jane Haycocks, Peter Harris, Keith Jackson, Simon Oldfield, Simon Reilly

Research output: Contribution to journalArticle

65 Citations (Scopus)

Abstract

It is now fully appreciated that metrology will play an integral role in the successful development and commercialization of micro- and nanotechnology. To this end, the UK Government, through the National Measurement System, funded several groundbreaking projects in its 2002-2005 Programme for Length. This paper will briefly describe the background of the research, concentrating on the technical details of the projects. The Programme for Length normally only funds work into dimensional metrology but this funding cycle also funded work into low force metrology as this area is crucial to most mechanical probing techniques. The projects described include a traceable areal contacting instrument designed to calibrate areal transfer artefacts and hence offer traceability for industrial areal instruments, the production of the areal transfer artefacts, the development of Internet-based softgauges for profile parameters, a primary low force balance with a force resolution of 50 pN and the development of methods for measuring complex micro-scale structures. Amongst others, the projects involved collaboration with PTB, TNO, Taylor Hobson, AWE, Rubert & Co. and the Universities of Warwick, Huddersfield and Eindhoven.

LanguageEnglish
Pages467-476
Number of pages10
JournalMeasurement Science and Technology
Volume17
Issue number3
Early online date31 Jan 2006
DOIs
Publication statusPublished - Mar 2006

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Metrology
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Traceability
Nanotechnology
trans-Neptunian objects
Measurement System
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Leach, Richard ; Chetwynd, Derek ; Blunt, Liam ; Haycocks, Jane ; Harris, Peter ; Jackson, Keith ; Oldfield, Simon ; Reilly, Simon. / Recent advances in traceable nanoscale dimension and force metrology in the UK. In: Measurement Science and Technology. 2006 ; Vol. 17, No. 3. pp. 467-476.
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Leach, R, Chetwynd, D, Blunt, L, Haycocks, J, Harris, P, Jackson, K, Oldfield, S & Reilly, S 2006, 'Recent advances in traceable nanoscale dimension and force metrology in the UK', Measurement Science and Technology, vol. 17, no. 3, pp. 467-476. https://doi.org/10.1088/0957-0233/17/3/S02

Recent advances in traceable nanoscale dimension and force metrology in the UK. / Leach, Richard; Chetwynd, Derek; Blunt, Liam; Haycocks, Jane; Harris, Peter; Jackson, Keith; Oldfield, Simon; Reilly, Simon.

In: Measurement Science and Technology, Vol. 17, No. 3, 03.2006, p. 467-476.

Research output: Contribution to journalArticle

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