Abstract
The need to produce a continuous representation of a curve (or part of a curve) from a set of discretely defined data arises in many metrological applications. In this paper we are interested in the reconstruction of continuous surface texture profiles defined only at discretely obtained points. By reconstructing surface profiles accurately, with elements of numerical safety being taken into account, we can provide a mathematically sound basis on which to compute surface texture profile parameters [1], especially those that do not allow exact evaluation with discrete data points. Examples are given to illustrate the advantages of using this reconstruction method.
| Original language | English |
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| Title of host publication | EUSPEN 2005 - Proceedings of the 5th International Conference of the European Society for Precision Engineering and Nanotechnology |
| Publisher | euspen |
| Pages | 257-260 |
| Number of pages | 4 |
| Publication status | Published - 2005 |
| Event | 5th International Conference of the European Society for Precision Engineering and Nanotechnology - Montpellier, France Duration: 8 May 2005 → 11 May 2005 Conference number: 5 |
Conference
| Conference | 5th International Conference of the European Society for Precision Engineering and Nanotechnology |
|---|---|
| Abbreviated title | EUSPEN 2005 |
| Country | France |
| City | Montpellier |
| Period | 8/05/05 → 11/05/05 |
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Cite this
Brennan, J. K., Crampton, A., Jiang, X., Leach, R. K., & Harris, P. A. (2005). Reconstruction of continuous surface profiles from discretely sampled data. In EUSPEN 2005 - Proceedings of the 5th International Conference of the European Society for Precision Engineering and Nanotechnology (pp. 257-260). euspen.