Reducing the latency between machining and measurement using FEA to predict thermal transient effects on CMM measurement

Naeem Mian, Simon Fletcher, Andrew Longstaff

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

1 results

Future Advanced Metrology Hub
Jiang, J., Martin, H., Longstaff, A., Kadirkamanathan, V., Turner, M. S., Keogh, P., Scott, P., McLeay, T. E., Blunt, L., Zeng, W., Huntley, J. M., Bills, P., Fletcher, S., Gao, F., Coupland, J. M., Kinnell, P., Mahfouf, M. & Mullineux, G.
1/10/16 → 30/09/23
Project: Research