Abstract
SNS collects beam current data associated with a machine trip. There are 3 categories of pulses recorded: the pulse before the trip, the tripping pulse and the rst pulse that successfully passes through the machine as the machine recovers from error.
This report describes an analysis where the K-nearest neighbors (K-NN) approach is applied to SNS pulse data as an attempt to classify pulses as one of the above mentioned categories: pre-trip pulse (bad) and post-trip pulse (good).
This report describes an analysis where the K-nearest neighbors (K-NN) approach is applied to SNS pulse data as an attempt to classify pulses as one of the above mentioned categories: pre-trip pulse (bad) and post-trip pulse (good).
Original language | English |
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Publication status | Unpublished - 18 Jan 2018 |