Research on a new measuring and analyzing system for curved surface topography

Xiangqian Jiang, Ting Xi Gu, Zhu Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

In this paper, a new measuring and analysing system for curved surfaces topography is described. The system working principle is discussed. The photoelectric signal processing,hardware and software designing and the model of data processing about curved surfaces are also investigated.Finally, experimental results are given.

Original languageEnglish
Title of host publicationMeasurement Technology and Intelligent Instruments
EditorsLi Zhu
PublisherSPIE
Pages1163-1167
Number of pages5
Volume2101
ISBN (Electronic)9780819413840
DOIs
Publication statusPublished - 22 Sep 1993
Externally publishedYes
EventMeasurement Technology and Intelligent Instruments 1993 - Wuhan, China
Duration: 29 Oct 19935 Nov 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2101
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceMeasurement Technology and Intelligent Instruments 1993
Country/TerritoryChina
CityWuhan
Period29/10/935/11/93

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