Abstract
Information navigation and search on the part of a user requires thorough description of the information content of signal and image datasets and archives. Large signal and image databases need comprehensive metadata to facilitate user access. There is no unique way to describe the semantics of images and signals. Therefore a conceptual model serves as an initial platform. From the conceptual model, a database design can be derived, or a definition of metadata. The different steps from model to description can benefit from tools such as the Unified Modeling Language (UML) for the conceptual model, standard Entity/Relationship (ER) models for database design, and eXtensible Markup Language (XML) for metadata description. As examples of the process of conceptual design and semantic description, we consider the case of a signal database, and the case of astronomical image databases.
| Original language | English |
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| Title of host publication | Opto-Ireland 2002 |
| Subtitle of host publication | Optical Metrology, Imaging, and Machine Vision |
| Editors | Andrew Shearer, Fionn D. Murtagh, James Mahon, Paul F. Whelan |
| Publisher | SPIE |
| Pages | 230-237 |
| Number of pages | 8 |
| Volume | 4877 |
| ISBN (Print) | 0819446580, 9780819446589 |
| DOIs | |
| Publication status | Published - 19 Mar 2003 |
| Externally published | Yes |
| Event | Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision - Galway, Ireland Duration: 5 Sep 2002 → 6 Sep 2002 https://www.researchgate.net/publication/260899755_Opto-Ireland_2002_Optical_Metrology_Imaging_and_Machine_Vision |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Publisher | SPIE |
| Volume | 4877 |
| ISSN (Print) | 0277-786X |
Conference
| Conference | Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision |
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| Country/Territory | Ireland |
| City | Galway |
| Period | 5/09/02 → 6/09/02 |
| Internet address |