Single atom electron energy-loss spectroscopy of implanted ions in carbon nanotubes

U. Bangert, A. L. Bleloch, M. Gass, J. Van Den Berg, A. J. Harvey, A. Seepujak

Research output: Contribution to journalArticle

Abstract

As a microanalytical technique, electron energy-loss (EEL) spectroscopy performed within a scanning transmission electron microscope (STEM) represents an outstanding method. The technique has led to remarkable success in spectroscopic chemical analysis. However, the question remains of whether the EEL signal of individual dopant atoms within a substrate can be detected, with simultaneous atomic-scale imaging of the microstructural surround. In the present contribution, results are presented of ultra-high spatially resolved EEL spectroscopy of ion implanted multi-walled carbon nanotubes (MWCNTs), performed within a Cs-corrected dedicated STEM. Quantifiable EEL signals with an absence of oversampling, suggest single implanted atoms were detected at certain locations.
LanguageEnglish
Article number012018
JournalJournal of Physics: Conference Series
Volume126
DOIs
Publication statusPublished - 2008
Externally publishedYes

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energy dissipation
carbon nanotubes
electron energy
spectroscopy
atoms
ions
electron microscopes
scanning
chemical analysis

Cite this

Bangert, U. ; Bleloch, A. L. ; Gass, M. ; Van Den Berg, J. ; Harvey, A. J. ; Seepujak, A. / Single atom electron energy-loss spectroscopy of implanted ions in carbon nanotubes. In: Journal of Physics: Conference Series. 2008 ; Vol. 126.
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Single atom electron energy-loss spectroscopy of implanted ions in carbon nanotubes. / Bangert, U.; Bleloch, A. L.; Gass, M.; Van Den Berg, J.; Harvey, A. J.; Seepujak, A.

In: Journal of Physics: Conference Series, Vol. 126, 012018, 2008.

Research output: Contribution to journalArticle

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