Abstract
A formation and thermal re-crystallization of amorphous zones on crystalline Si which have been created by single ion impacts with a range of species and energies have been studied. Different kinds of defects, including point defects and dislocation loops, were observed. The role of bond defect, or vacancy-interstitial pair in amorphization and re-crystallization of silicon has been discussed.
Original language | English |
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Pages (from-to) | 893-896 |
Number of pages | 4 |
Journal | Bulletin of the Russian Academy of Sciences: Physics |
Volume | 70 |
Issue number | 6 |
Publication status | Published - 2006 |
Externally published | Yes |