Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation

S. E. Donnelly, R. C. Birtcher, K. Nordlund

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Citations (Scopus)

Abstract

The combination of in situ electron microscopy with molecular dynamics (MD) simulations gives important insights into the processes occurring during ion-beam engineering of thin films. This chapter compares and contrasts experimental observations and MD simulations of individual heavy-ion impacts on metal films. These impacts result in the formation of craters and other surface features on metals and the ejection of nanoparticles. Images in the manuscript and video sequences on the accompanying CD-ROM illustrate the processes. The simulations of ion impacts match the experiment and give remarkable insight into the processes that give rise to the observed surface structures. Liquid flow and micro-explosions have been unequivocally identified in the MD work and provide an atomic-level understanding of the processes giving rise to cratering. An incomplete understanding exists of the emission of nanoclusters by ion impacts where the experimental size distribution of the emitted particles exhibits a powerlaw relationship, suggesting that this could be a shock-wave phenomenon. Although this is not, as yet, supported by the MD work, further simulations giving rise to improved statistics on nanocluster emission should enable a better comparison between experiment and simulation and thus serve to test this interpretation.

LanguageEnglish
Title of host publicationEngineering Thin Films and Nanostructures with Ion Beams
EditorsEmile Knystautas
Place of PublicationNew York
PublisherCRC Press
Chapter2
Pages7-78
Number of pages72
Edition1
ISBN (Electronic)9781420028294
ISBN (Print)9780824724474, 082472447X
DOIs
Publication statusPublished - 2005
Externally publishedYes

Fingerprint

metal films
spikes
Molecular dynamics
Metals
ion impact
Ions
Nanoclusters
molecular dynamics
ions
nanoclusters
simulation
Heavy Ions
CD-ROM
Computer simulation
cratering
Heavy ions
Surface structure
Shock waves
Ion beams
Electron microscopy

Cite this

Donnelly, S. E., Birtcher, R. C., & Nordlund, K. (2005). Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation. In E. Knystautas (Ed.), Engineering Thin Films and Nanostructures with Ion Beams (1 ed., pp. 7-78). New York: CRC Press. https://doi.org/10.1201/9781420028294
Donnelly, S. E. ; Birtcher, R. C. ; Nordlund, K. / Single Ion Induced Spike Effects on Thin Metal Films : Observation and Simulation. Engineering Thin Films and Nanostructures with Ion Beams. editor / Emile Knystautas. 1. ed. New York : CRC Press, 2005. pp. 7-78
@inbook{fc3abe37211d45b38b097e728900f022,
title = "Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation",
abstract = "The combination of in situ electron microscopy with molecular dynamics (MD) simulations gives important insights into the processes occurring during ion-beam engineering of thin films. This chapter compares and contrasts experimental observations and MD simulations of individual heavy-ion impacts on metal films. These impacts result in the formation of craters and other surface features on metals and the ejection of nanoparticles. Images in the manuscript and video sequences on the accompanying CD-ROM illustrate the processes. The simulations of ion impacts match the experiment and give remarkable insight into the processes that give rise to the observed surface structures. Liquid flow and micro-explosions have been unequivocally identified in the MD work and provide an atomic-level understanding of the processes giving rise to cratering. An incomplete understanding exists of the emission of nanoclusters by ion impacts where the experimental size distribution of the emitted particles exhibits a powerlaw relationship, suggesting that this could be a shock-wave phenomenon. Although this is not, as yet, supported by the MD work, further simulations giving rise to improved statistics on nanocluster emission should enable a better comparison between experiment and simulation and thus serve to test this interpretation.",
author = "Donnelly, {S. E.} and Birtcher, {R. C.} and K. Nordlund",
year = "2005",
doi = "10.1201/9781420028294",
language = "English",
isbn = "9780824724474",
pages = "7--78",
editor = "Emile Knystautas",
booktitle = "Engineering Thin Films and Nanostructures with Ion Beams",
publisher = "CRC Press",
edition = "1",

}

Donnelly, SE, Birtcher, RC & Nordlund, K 2005, Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation. in E Knystautas (ed.), Engineering Thin Films and Nanostructures with Ion Beams. 1 edn, CRC Press, New York, pp. 7-78. https://doi.org/10.1201/9781420028294

Single Ion Induced Spike Effects on Thin Metal Films : Observation and Simulation. / Donnelly, S. E.; Birtcher, R. C.; Nordlund, K.

Engineering Thin Films and Nanostructures with Ion Beams. ed. / Emile Knystautas. 1. ed. New York : CRC Press, 2005. p. 7-78.

Research output: Chapter in Book/Report/Conference proceedingChapter

TY - CHAP

T1 - Single Ion Induced Spike Effects on Thin Metal Films

T2 - Observation and Simulation

AU - Donnelly, S. E.

AU - Birtcher, R. C.

AU - Nordlund, K.

PY - 2005

Y1 - 2005

N2 - The combination of in situ electron microscopy with molecular dynamics (MD) simulations gives important insights into the processes occurring during ion-beam engineering of thin films. This chapter compares and contrasts experimental observations and MD simulations of individual heavy-ion impacts on metal films. These impacts result in the formation of craters and other surface features on metals and the ejection of nanoparticles. Images in the manuscript and video sequences on the accompanying CD-ROM illustrate the processes. The simulations of ion impacts match the experiment and give remarkable insight into the processes that give rise to the observed surface structures. Liquid flow and micro-explosions have been unequivocally identified in the MD work and provide an atomic-level understanding of the processes giving rise to cratering. An incomplete understanding exists of the emission of nanoclusters by ion impacts where the experimental size distribution of the emitted particles exhibits a powerlaw relationship, suggesting that this could be a shock-wave phenomenon. Although this is not, as yet, supported by the MD work, further simulations giving rise to improved statistics on nanocluster emission should enable a better comparison between experiment and simulation and thus serve to test this interpretation.

AB - The combination of in situ electron microscopy with molecular dynamics (MD) simulations gives important insights into the processes occurring during ion-beam engineering of thin films. This chapter compares and contrasts experimental observations and MD simulations of individual heavy-ion impacts on metal films. These impacts result in the formation of craters and other surface features on metals and the ejection of nanoparticles. Images in the manuscript and video sequences on the accompanying CD-ROM illustrate the processes. The simulations of ion impacts match the experiment and give remarkable insight into the processes that give rise to the observed surface structures. Liquid flow and micro-explosions have been unequivocally identified in the MD work and provide an atomic-level understanding of the processes giving rise to cratering. An incomplete understanding exists of the emission of nanoclusters by ion impacts where the experimental size distribution of the emitted particles exhibits a powerlaw relationship, suggesting that this could be a shock-wave phenomenon. Although this is not, as yet, supported by the MD work, further simulations giving rise to improved statistics on nanocluster emission should enable a better comparison between experiment and simulation and thus serve to test this interpretation.

UR - http://www.scopus.com/inward/record.url?scp=79952978304&partnerID=8YFLogxK

U2 - 10.1201/9781420028294

DO - 10.1201/9781420028294

M3 - Chapter

SN - 9780824724474

SN - 082472447X

SP - 7

EP - 78

BT - Engineering Thin Films and Nanostructures with Ion Beams

A2 - Knystautas, Emile

PB - CRC Press

CY - New York

ER -

Donnelly SE, Birtcher RC, Nordlund K. Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation. In Knystautas E, editor, Engineering Thin Films and Nanostructures with Ion Beams. 1 ed. New York: CRC Press. 2005. p. 7-78 https://doi.org/10.1201/9781420028294