Solar cells micro crack detection technique using state-of-the-art electroluminescence imaging

Research output: Contribution to journalArticle

Abstract

in this article, we present the development of novel technique that is used to enhance the detection of micro cracks in solar cells. Initially, the output image of a conventional electroluminescence (EL) system is determined and reprocessed using a binary and discreet Fourier transform (DFT) image processing models. The binary image is used to enhance the detection of the cracks size, position and orientation, principally using the geometric properties of the EL image. On the other hand, the DFT has been used to analyse the EL image in two-dimensional spectrum. The output image of the DFT consists of structures of all required frequencies, hence, improve the detection of possible cracks presents in the solar cell. As a result, the developed technique improves the detection of micro cracks in solar cells compared to conventional EL output images.
Original languageEnglish
JournalJournal of Science: Advanced Materials and Devices
Early online date30 Oct 2019
DOIs
Publication statusE-pub ahead of print - 30 Oct 2019

Fingerprint

Crack detection
Electroluminescence
Solar cells
Cracks
Imaging techniques
Fourier transforms
Binary images
Image processing

Cite this

@article{54c8435112784a7099922a504ec41570,
title = "Solar cells micro crack detection technique using state-of-the-art electroluminescence imaging",
abstract = "in this article, we present the development of novel technique that is used to enhance the detection of micro cracks in solar cells. Initially, the output image of a conventional electroluminescence (EL) system is determined and reprocessed using a binary and discreet Fourier transform (DFT) image processing models. The binary image is used to enhance the detection of the cracks size, position and orientation, principally using the geometric properties of the EL image. On the other hand, the DFT has been used to analyse the EL image in two-dimensional spectrum. The output image of the DFT consists of structures of all required frequencies, hence, improve the detection of possible cracks presents in the solar cell. As a result, the developed technique improves the detection of micro cracks in solar cells compared to conventional EL output images.",
keywords = "Solar Cells, Photovoltaic (PV) cracks, Electroluminescence (EL) method, DFT calculations, Binary Measurement System, EL Imaging, Micro cracks, Photovoltaics",
author = "Mahmoud Dhimish and Violeta Holmes",
year = "2019",
month = "10",
day = "30",
doi = "10.1016/j.jsamd.2019.10.004",
language = "English",
journal = "Journal of Science: Advanced Materials and Devices",
issn = "2468-2284",
publisher = "Elsevier",

}

TY - JOUR

T1 - Solar cells micro crack detection technique using state-of-the-art electroluminescence imaging

AU - Dhimish, Mahmoud

AU - Holmes, Violeta

PY - 2019/10/30

Y1 - 2019/10/30

N2 - in this article, we present the development of novel technique that is used to enhance the detection of micro cracks in solar cells. Initially, the output image of a conventional electroluminescence (EL) system is determined and reprocessed using a binary and discreet Fourier transform (DFT) image processing models. The binary image is used to enhance the detection of the cracks size, position and orientation, principally using the geometric properties of the EL image. On the other hand, the DFT has been used to analyse the EL image in two-dimensional spectrum. The output image of the DFT consists of structures of all required frequencies, hence, improve the detection of possible cracks presents in the solar cell. As a result, the developed technique improves the detection of micro cracks in solar cells compared to conventional EL output images.

AB - in this article, we present the development of novel technique that is used to enhance the detection of micro cracks in solar cells. Initially, the output image of a conventional electroluminescence (EL) system is determined and reprocessed using a binary and discreet Fourier transform (DFT) image processing models. The binary image is used to enhance the detection of the cracks size, position and orientation, principally using the geometric properties of the EL image. On the other hand, the DFT has been used to analyse the EL image in two-dimensional spectrum. The output image of the DFT consists of structures of all required frequencies, hence, improve the detection of possible cracks presents in the solar cell. As a result, the developed technique improves the detection of micro cracks in solar cells compared to conventional EL output images.

KW - Solar Cells

KW - Photovoltaic (PV) cracks

KW - Electroluminescence (EL) method

KW - DFT calculations

KW - Binary Measurement System

KW - EL Imaging

KW - Micro cracks

KW - Photovoltaics

U2 - 10.1016/j.jsamd.2019.10.004

DO - 10.1016/j.jsamd.2019.10.004

M3 - Article

JO - Journal of Science: Advanced Materials and Devices

JF - Journal of Science: Advanced Materials and Devices

SN - 2468-2284

ER -