TY - JOUR
T1 - Solar cells micro crack detection technique using state-of-the-art electroluminescence imaging
AU - Dhimish, Mahmoud
AU - Holmes, Violeta
PY - 2019/12/1
Y1 - 2019/12/1
N2 - In this article, we present the development of a novel technique that is used to enhance the detection of micro cracks in solar cells. Initially, the output image of a conventional electroluminescence (EL) system is determined and reprocessed using the binary and discreet Fourier transform (DFT) image processing models. The binary image is used to enhance the detection of the cracks size, position and orientation, principally using the geometric properties of the EL image. On the other hand, the DFT has been used to analyse the EL image in a two-dimensional spectrum. The output image of the DFT consists of structures of all required frequencies, thus improving the detection of possible cracks present in the solar cell. As a result, the developed technique improves the detection of micro cracks in solar cells compared to conventional EL output images.
AB - In this article, we present the development of a novel technique that is used to enhance the detection of micro cracks in solar cells. Initially, the output image of a conventional electroluminescence (EL) system is determined and reprocessed using the binary and discreet Fourier transform (DFT) image processing models. The binary image is used to enhance the detection of the cracks size, position and orientation, principally using the geometric properties of the EL image. On the other hand, the DFT has been used to analyse the EL image in a two-dimensional spectrum. The output image of the DFT consists of structures of all required frequencies, thus improving the detection of possible cracks present in the solar cell. As a result, the developed technique improves the detection of micro cracks in solar cells compared to conventional EL output images.
KW - Solar Cells
KW - Photovoltaic (PV) cracks
KW - Electroluminescence (EL) method
KW - DFT calculations
KW - Binary Measurement System
KW - EL Imaging
KW - Micro cracks
KW - Photovoltaics
KW - Solar cells
KW - EL imaging
UR - http://www.scopus.com/inward/record.url?scp=85075430899&partnerID=8YFLogxK
U2 - 10.1016/j.jsamd.2019.10.004
DO - 10.1016/j.jsamd.2019.10.004
M3 - Article
VL - 4
SP - 499
EP - 508
JO - Journal of Science: Advanced Materials and Devices
JF - Journal of Science: Advanced Materials and Devices
SN - 2468-2284
IS - 4
ER -