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This paper reviews recent developments of non-contact three-dimensional (3D) surface metrology using an active structured optical probe. We focus primarily on those active non-contact 3D surface measurement techniques that could be applicable to the manufacturing industry. We discuss principles of each technology, and its advantageous characteristics as well as limitations. Towards the end, we discuss our perspectives on the current technological challenges in designing and implementing these methods in practical applications.
|Number of pages||18|
|Journal||Journal of the Optical Society of America A: Optics and Image Science, and Vision|
|Early online date||7 Aug 2020|
|Publication status||Published - 1 Sep 2020|
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Future Advanced Metrology Hub
Jiang, J., Martin, H., Longstaff, A., Kadirkamanathan, V., Turner, M. S., Keogh, P., Scott, P., McLeay, T. E., Blunt, L., Zeng, W., Huntley, J. M., Bills, P., Fletcher, S., Gao, F., Coupland, J. M., Kinnell, P., Mahfouf, M. & Mullineux, G.
1/10/16 → 30/09/23