Structure of nanometre-sized Xe particles embedded in Al crystals

M. Song, K. Mitsuishi, K. Furuya, C. W. Allen, R. C. Birtcher, S. E. Donnelly

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The structure and lattice parameters of Xe particles about 1 nm to about 6 nm in size embedded in Al were investigated with off-Bragg condition high-resolution transmission electron microscopy. An Xe particle about 1 nm in size had different structural properties from those 2-6 nm in sizes. Some 1-nm Xe particles had an face-centred cubic (f.c.c.) structure with the same orientation as the Al matrix, whereas others of the same size had a non-f.c.c, structure. The lattice parameters of a 1-nm f.c.c. Xe particle were about 20% smaller than the average value obtained from electron diffraction, i.e. the particle was compressed by about 80%. The lattice parameters of Xe crystals about 2 nm to about 6 nm in size were almost the same as those obtained from diffraction results. One of the reasons for the extra compression seen with a 1-nm Xe particle is the increase in pressure inside an Xe particle with decreasing particle size.

LanguageEnglish
Pages224-229
Number of pages6
JournalJournal of Microscopy
Volume215
Issue number3
Early online date13 Aug 2004
DOIs
Publication statusPublished - 1 Sep 2004
Externally publishedYes

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Transmission Electron Microscopy
Particle Size
Electrons
Pressure

Cite this

Song, M. ; Mitsuishi, K. ; Furuya, K. ; Allen, C. W. ; Birtcher, R. C. ; Donnelly, S. E. / Structure of nanometre-sized Xe particles embedded in Al crystals. In: Journal of Microscopy. 2004 ; Vol. 215, No. 3. pp. 224-229.
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Song, M, Mitsuishi, K, Furuya, K, Allen, CW, Birtcher, RC & Donnelly, SE 2004, 'Structure of nanometre-sized Xe particles embedded in Al crystals', Journal of Microscopy, vol. 215, no. 3, pp. 224-229. https://doi.org/10.1111/j.0022-2720.2004.01369.x

Structure of nanometre-sized Xe particles embedded in Al crystals. / Song, M.; Mitsuishi, K.; Furuya, K.; Allen, C. W.; Birtcher, R. C.; Donnelly, S. E.

In: Journal of Microscopy, Vol. 215, No. 3, 01.09.2004, p. 224-229.

Research output: Contribution to journalArticle

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