Structure variation of nanometer-sized Xe particles embedded in Al crystals

M. Song, K. Mitsuishi, K. Furuya, C. W. Allen, R. C. Birtcher, S. E. Donnelly

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Nanometer-sized Xe particles embedded in Al are observed with an off-Bragg condition high resolution transmission electron microscopy. It is found that a Xe particle with size of about 1 nm shows quite different structural properties from those with larger sizes. It changes structure from an f.c.c. to another one, changes orientation with the same f.c.c. structure, or changes shape and sizes. These changes are attributed to (1) a high mobility of atoms on Xe/Al interface due to irradiation of 1 MeV electron beam and irradiation enhanced interfacial diffusion; (2) a smaller barrier in energy for shape change of a smaller Al void where the Xe particle is constrained; (3) a larger fraction of atoms on Xe/Al interface for a smaller Xe particle.

Original languageEnglish
Pages (from-to)96-101
Number of pages6
JournalApplied Surface Science
Volume241
Issue number1-2
Early online date18 Oct 2004
DOIs
Publication statusPublished - 28 Feb 2005
Externally publishedYes

Fingerprint

Dive into the research topics of 'Structure variation of nanometer-sized Xe particles embedded in Al crystals'. Together they form a unique fingerprint.

Cite this