Surface measurement using active vision and light scattering

Gui Yun Tian, Rong Sheng Lu, Duke Gledhill

Research output: Contribution to journalArticle

57 Citations (Scopus)

Abstract

This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.

Original languageEnglish
Pages (from-to)131-139
Number of pages9
JournalOptics and Lasers in Engineering
Volume45
Issue number1
DOIs
Publication statusPublished - Jan 2007

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Surface measurement
Light scattering
light scattering
Surface roughness
Surface defects
surface defects
scattering
inspection
surface roughness
roughness
Inspection

Cite this

Tian, Gui Yun ; Lu, Rong Sheng ; Gledhill, Duke. / Surface measurement using active vision and light scattering. In: Optics and Lasers in Engineering. 2007 ; Vol. 45, No. 1. pp. 131-139.
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Surface measurement using active vision and light scattering. / Tian, Gui Yun; Lu, Rong Sheng; Gledhill, Duke.

In: Optics and Lasers in Engineering, Vol. 45, No. 1, 01.2007, p. 131-139.

Research output: Contribution to journalArticle

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