Abstract
This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.
Original language | English |
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Pages (from-to) | 131-139 |
Number of pages | 9 |
Journal | Optics and Lasers in Engineering |
Volume | 45 |
Issue number | 1 |
DOIs | |
Publication status | Published - Jan 2007 |