Surface measurement using active vision and light scattering

Gui Yun Tian; Rong Sheng Lu; Duke Gledhill

doi:10.1016/j.optlaseng.2006.03.005

Surface measurement using active vision and light scattering

Gui Yun Tian, Rong Sheng Lu, Duke Gledhill

Hefei University of Technology

Research output: Contribution to journal › Article › peer-review

77 Citations (Scopus)

Abstract

This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.

Original language	English
Pages (from-to)	131-139
Number of pages	9
Journal	Optics and Lasers in Engineering
Volume	45
Issue number	1
DOIs	https://doi.org/10.1016/j.optlaseng.2006.03.005
Publication status	Published - Jan 2007

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10.1016/j.optlaseng.2006.03.005

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title = "Surface measurement using active vision and light scattering",

abstract = "This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.",

keywords = "Active vision, Light scattering, Speckle pattern, Surface measurement",

author = "Tian, \{Gui Yun\} and Lu, \{Rong Sheng\} and Duke Gledhill",

year = "2007",

month = jan,

doi = "10.1016/j.optlaseng.2006.03.005",

language = "English",

volume = "45",

pages = "131--139",

journal = "Optics and Lasers in Engineering",

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AU - Tian, Gui Yun

AU - Lu, Rong Sheng

AU - Gledhill, Duke

PY - 2007/1

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N2 - This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.

AB - This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.

KW - Active vision

KW - Light scattering

KW - Speckle pattern

KW - Surface measurement

UR - https://www.scopus.com/pages/publications/33748741713

U2 - 10.1016/j.optlaseng.2006.03.005

DO - 10.1016/j.optlaseng.2006.03.005

M3 - Article

AN - SCOPUS:33748741713

SN - 0143-8166

VL - 45

SP - 131

EP - 139

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

IS - 1

ER -

Surface measurement using active vision and light scattering

Abstract

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