Surface metrology, a new philosophical approach

P. J. Scott

doi:10.1016/0043-1648(86)90270-X

Surface metrology, a new philosophical approach

P. J. Scott

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

A new philosophical approach to surface metrology is described. This defines surface metrology in terms of user areas of interest, rather than via wavelength bands. This enables measurement problems to be dealt with at an "engineering level" rather than at a "parameter level", which eases the interpretation of results.

Original language	English
Pages (from-to)	267-274
Number of pages	8
Journal	Wear
Volume	109
Issue number	1-4
DOIs	https://doi.org/10.1016/0043-1648(86)90270-X
Publication status	Published - May 1986
Externally published	Yes

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10.1016/0043-1648(86)90270-X

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Surface metrology, a new philosophical approach

Abstract

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