Surface roughness and contact angle of bias sputtered CoCrTa film

R. Chandrasekhar, D. J. Mapps, L. Blunt

Research output: Contribution to journal › Article

1 Citation (Scopus)

Abstract

Surface roughness of bias sputtered CoCrTa films on glass substrates were studied using an Atomic Force Microscope (AFM) and an interferometer (non contact) optical technique (IOT). Contact angles of the coated disks were measured using a goniometer microscope. Wear tests were performed on the bias sputtered films. The results of these investigations are presented.

Original languageEnglish
Pages (from-to)3681-3683
Number of pages3
JournalIEEE Transactions on Magnetics
Volume32
Issue number5
DOIs
Publication statusPublished - Sep 1996
Externally publishedYes

Fingerprint

Contact angle
Microscopes
Surface roughness
Goniometers
Interferometers
Contacts (fluid mechanics)
Wear of materials
Glass
Substrates

Cite this

Chandrasekhar, R. ; Mapps, D. J. ; Blunt, L. / Surface roughness and contact angle of bias sputtered CoCrTa film. In: IEEE Transactions on Magnetics. 1996 ; Vol. 32, No. 5. pp. 3681-3683.
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Chandrasekhar, R, Mapps, DJ & Blunt, L 1996, 'Surface roughness and contact angle of bias sputtered CoCrTa film', IEEE Transactions on Magnetics, vol. 32, no. 5, pp. 3681-3683. https://doi.org/10.1109/20.538727

Surface roughness and contact angle of bias sputtered CoCrTa film. / Chandrasekhar, R.; Mapps, D. J.; Blunt, L.

In: IEEE Transactions on Magnetics, Vol. 32, No. 5, 09.1996, p. 3681-3683.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Surface roughness and contact angle of bias sputtered CoCrTa film

AU - Chandrasekhar, R.

AU - Mapps, D. J.

AU - Blunt, L.

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N2 - Surface roughness of bias sputtered CoCrTa films on glass substrates were studied using an Atomic Force Microscope (AFM) and an interferometer (non contact) optical technique (IOT). Contact angles of the coated disks were measured using a goniometer microscope. Wear tests were performed on the bias sputtered films. The results of these investigations are presented.

AB - Surface roughness of bias sputtered CoCrTa films on glass substrates were studied using an Atomic Force Microscope (AFM) and an interferometer (non contact) optical technique (IOT). Contact angles of the coated disks were measured using a goniometer microscope. Wear tests were performed on the bias sputtered films. The results of these investigations are presented.

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KW - Surface roughness

KW - Optical films

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KW - Optical interferometry

KW - Glass

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KW - Atomic measurements

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Chandrasekhar R, Mapps DJ, Blunt L. Surface roughness and contact angle of bias sputtered CoCrTa film. IEEE Transactions on Magnetics. 1996 Sep;32(5):3681-3683. https://doi.org/10.1109/20.538727

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