Technological Shifts in Surface Metrology

X. Jane Jiang, David J. Whitehouse

Research output: Contribution to journalArticle

145 Citations (Scopus)

Abstract

This paper gives an overview of the progress which has been made in surface metrology over the past ten years. It updates the surface classification system, and discusses the practical and theoretical reasons for the technological shifts which have occurred. This includes the use of surfaces with predetermined features as an alternative to traditional machined surfaces, and the move from simple to freeform shapes. The paper discusses technological shifts in association, filtration, numeric parametric techniques, fractals associated with function and standardisation. Many examples are given in order to contextualise the significance of these technological changes. This paper should help to predict the direction of future developments in surface metrology, and therefore emphasise its importance in functional applications in advanced manufacture.

LanguageEnglish
Pages815-836
Number of pages22
JournalCIRP Annals - Manufacturing Technology
Volume61
Issue number2
DOIs
Publication statusPublished - 27 Jun 2012

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Jiang, X. Jane ; Whitehouse, David J. / Technological Shifts in Surface Metrology. In: CIRP Annals - Manufacturing Technology. 2012 ; Vol. 61, No. 2. pp. 815-836.
@article{0a275e30bbda40a9bcdcf4d1993a0693,
title = "Technological Shifts in Surface Metrology",
abstract = "This paper gives an overview of the progress which has been made in surface metrology over the past ten years. It updates the surface classification system, and discusses the practical and theoretical reasons for the technological shifts which have occurred. This includes the use of surfaces with predetermined features as an alternative to traditional machined surfaces, and the move from simple to freeform shapes. The paper discusses technological shifts in association, filtration, numeric parametric techniques, fractals associated with function and standardisation. Many examples are given in order to contextualise the significance of these technological changes. This paper should help to predict the direction of future developments in surface metrology, and therefore emphasise its importance in functional applications in advanced manufacture.",
keywords = "Characterisation, Surface Metrology, Surface Texture",
author = "Jiang, {X. Jane} and Whitehouse, {David J.}",
year = "2012",
month = "6",
day = "27",
doi = "10.1016/j.cirp.2012.05.009",
language = "English",
volume = "61",
pages = "815--836",
journal = "CIRP Annals - Manufacturing Technology",
issn = "0007-8506",
publisher = "Elsevier USA",
number = "2",

}

Technological Shifts in Surface Metrology. / Jiang, X. Jane; Whitehouse, David J.

In: CIRP Annals - Manufacturing Technology, Vol. 61, No. 2, 27.06.2012, p. 815-836.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Technological Shifts in Surface Metrology

AU - Jiang, X. Jane

AU - Whitehouse, David J.

PY - 2012/6/27

Y1 - 2012/6/27

N2 - This paper gives an overview of the progress which has been made in surface metrology over the past ten years. It updates the surface classification system, and discusses the practical and theoretical reasons for the technological shifts which have occurred. This includes the use of surfaces with predetermined features as an alternative to traditional machined surfaces, and the move from simple to freeform shapes. The paper discusses technological shifts in association, filtration, numeric parametric techniques, fractals associated with function and standardisation. Many examples are given in order to contextualise the significance of these technological changes. This paper should help to predict the direction of future developments in surface metrology, and therefore emphasise its importance in functional applications in advanced manufacture.

AB - This paper gives an overview of the progress which has been made in surface metrology over the past ten years. It updates the surface classification system, and discusses the practical and theoretical reasons for the technological shifts which have occurred. This includes the use of surfaces with predetermined features as an alternative to traditional machined surfaces, and the move from simple to freeform shapes. The paper discusses technological shifts in association, filtration, numeric parametric techniques, fractals associated with function and standardisation. Many examples are given in order to contextualise the significance of these technological changes. This paper should help to predict the direction of future developments in surface metrology, and therefore emphasise its importance in functional applications in advanced manufacture.

KW - Characterisation

KW - Surface Metrology

KW - Surface Texture

UR - http://www.scopus.com/inward/record.url?scp=84865696363&partnerID=8YFLogxK

U2 - 10.1016/j.cirp.2012.05.009

DO - 10.1016/j.cirp.2012.05.009

M3 - Article

VL - 61

SP - 815

EP - 836

JO - CIRP Annals - Manufacturing Technology

T2 - CIRP Annals - Manufacturing Technology

JF - CIRP Annals - Manufacturing Technology

SN - 0007-8506

IS - 2

ER -